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Displaying 11 - 50 of 1138 results.

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    • Journal article
    A 2.5-GHz Clock Recovery Circuit Based on a Back-Bias-Controlled Oscillator in 28-nm FDSOI
    Schramme, Maxime[UCL] Gimeno Gasca, Cecilia[UCL] Cathelin, Andreia Flandre, Denis[UCL] Bol, David[UCL] (2020) IEEE Solid-State Circuits Letters — Vol. 3, p. 478-481 (2020)
    • Speech
    Tuning Range Comparison Between Different Planar Inductors Layouts on PCB
    Kaziz, Sinda Maamer, Bilal Delhaye, Thibault[UCL] Tounsi, Fares[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2020) IEEE International Conference on Design & Test of Integrated micro & nano-Systems (DTS 2020) — Hammamet (Tunisia)
    • Journal article
    Performances Evaluation of On-chip Large-Size Tapped Transformer for MEMS applications
    Tounsi, Fares[UCL] Flandre, Denis[UCL] Rufer, Libor Francis, Laurent[UCL] (2020) IEEE Transactions on Instrumentation and Measurement — Vol. 69, no. 9, p. 7051-7060 (2020)
    • Journal article
    Structural and Opto‑electronic characterization of CuO thin films prepared by DC reactive magnetron sputtering
    Zeng, Xi[UCL] Zhukova, Maria[UCL] Faniel, Sébastien[UCL] Proost, Joris[UCL] Flandre, Denis[UCL] (2020) Journal of Materials Science: Materials in Electronics — Vol. 31, p. 4563-4573 (2020)
    • Journal article
    New Universal Figure of Merit for Embedded Si Piezoresistive Pressure Sensors
    Delhaye, Thibault[UCL] André, Nicolas[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2021) IEEE SENSORS JOURNAL — Vol. 21, no. 1, p. 213-221 (2021)
    • Journal article
    A Self-Gating RF Energy Harvester for Wireless Power Transfer With High-PAPR Incident Waveform
    Xu, Pengcheng[UCL] Flandre, Denis[UCL] Bol, David[UCL] (2021) IEEE Journal of Solid-State Circuits — Vol. 56, no.6, p. 1816-1826 (2021)
    • Journal article
    Trap Recovery by in-Situ Annealing in Fully-Depleted MOSFET With Active Silicide Resistor
    Amor, Sedki[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Galy, Philippe (2021) IEEE Electron Device Letters — Vol. 42, no.7, p. 1085-1088 (2021)
    • Speech
    Defect Engineering in n‐Type Oxide Semiconductor TFTs
    Li, Guoli He, Jiawei Flandre, Denis[UCL] Liao, Lei (2021) International Conference on Display Technology 2021 (ICDT 2021) — Beijing (China)

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