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    Using Statistical Student's t-Test to Qualify the Electrical Performance of the Diamond MOSFETs
    Vono Peruzzi, Vinicius da Silva, Gabriel Augusto Renaux, Christian[UCL] Flandre, Denis[UCL] Pinillos Gimenez, Salvador (2018) 2018 33rd Symposium on Microelectronics Technology and devices (SBMicro 2018) — Bento Gonçalves, Rio Grande do Sul (Brazil )