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    • Journal article
    Revision of interface coupling in ultra-thin body silicon-on-insulator MOSFETs
    Rudenko, Tamara Nazarov, Alexei Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Popov, V. Ilnitsky, M. Lysenko, V. (2013) Semiconductor Physics, Quantum Electronics & Optoelectronics — Vol. 16, no.3, p. 300-309 (30/09/2013)
    • Speech
    Threshold voltage of advanced MOSFETs: Physical criteria and experimental extraction methods
    Rudenko, Tamara Nazarov, Alexei Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2012) International Conference "Micro- and Nanoelectronics-2012" (ICMNE-2012) — Moscow-Zvenigorod (Russia)
    • Speech
    Properties of SOI MOSFETs obtained on multilayer buried dielectrics
    Lysenko, V.S. Nazarov, Alexei Rudenko, Tamara Rudenko, A.N. Kilchytska, Valeriya[UCL] Givargizov, E.I. Limanov, A.B. (1994) 6th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — San Francisco (USA)
    • Speech
    Charge carrier injection and trapping in the buried oxides of SOI structures
    Nazarov, Alexei Kilchytska, Valeriya[UCL] Barchuk, I.P. (2000) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
    • Journal article
    High-temperature characteristics of zone-melting recrystallized silicon-on-insulator MOSFETs
    Lysenko, V.S. Nazarov, Alexei Kilchytska, Valeriya[UCL] Rudenko, Tamara Limanov, A.B. Colinge, Jean-Pierre (1998) Semiconductor Physics, Quantum Electronics & Optoelectronics — Vol. 1, no. 1, p. 101-107 (28/10/1998)
    • BookChapter
    Bias-temperature phenomena in SOI structures and devices
    Nazarov, Alexei Barchuk, I.P. Kilchytska, Valeriya[UCL] (2000) Perspectives, Science and Technologies for Novel Silicon on Insulator Devices — [ISBN : 0-7923-6116-4]
    • Journal article
    High-field current transport and charge trapping in buried oxide of SOI materials under high-field electron injection
    Nazarov, Alexei Kilchytska, Valeriya[UCL] Houk, Youri (2004) Journal of Telecommunications and Information Technology — Vol. 94, no. 1, p. 12 (2004)
    • Journal article
    RF plasma annealing of the positive charge created by Fowler-Nordheim electron injection in buried oxide of SIMOX SOI structure
    Nazarov, Alexei Kilchytska, Valeriya[UCL] Barchuk, I.P. Tkachenko, A.S. Ashok, S. (2000) Journal of Vacuum Science & Technology. A: International Journal Devoted to Vacuum, Surfaces, and Films — Vol. 18, no.3, p. 1156-1164 (2000)
    • BookChapter
    Total dose radiation response of multilayer buried insulators
    Rudenko, A.N. Nazarov, Alexei Lysenko, V.S. Kilchytska, Valeriya Rudenko, Tamara Djurenko, S.V. (2000) Perspectives, Science and Technologies for Novel Silicon on Insulator Devices — [ISBN : 978-0-7923-6117-6]
    • Speech
    C infinite - continuous AM SOI pMOSFET Model for High-Temperature Applications
    Houk, Youri Iniguez, Benjamin Flandre, Denis[UCL] Nazarov, Alexei (2005) First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2005) — Granada (Spain)
    • Speech
    RF Plasma Annealing of Positive Charge Created by Fowler-Nordheim Electron Injection in the Buried Oxide of SIMOX SOI structures
    Kilchytska, Valeriya Nazarov, Alexei Barchuk, I. Tkachenko, A. Ashok, D. Ballutaud, D. (2000) NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" — Kiev (Ukraine)
    • Speech
    C-V and thermally activated investigations of ZMR SOI meza structures
    Nazarov, Alexei Lysenko, V.S. Gusev, V.A. Kilchytska, Valeriya[UCL] (1994) 6th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" — San Francisco (USA)
    • Speech
    Electrical properties of FinFET structures
    Rudenko, Tamara Kilchytska, Valeriya[UCL] Collaert, N. Jurczak, Malgorzata Nazarov, Alexei Flandre, Denis[UCL] (2007) III Ukrainian Conference on Semiconductor Physics — Odessa (Ukraine)
    • Speech
    Extraction of charge trapping parameters in FD SOI MOSFET oxides subjected to gamma-irradiation
    Houk, Youri Nazarov, Alexei Turchanikov, V.I. Lysenko, V.S. Adriaensen, Stéphane[UCL] Flandre, Denis[UCL] (2005) First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2005) — Granada (Spain)

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