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    Extraction of charge trapping parameters in FD SOI MOSFET oxides subjected to gamma-irradiation
    Houk, Youri Nazarov, Alexei Turchanikov, V.I. Lysenko, V.S. Adriaensen, Stéphane[UCL] Flandre, Denis[UCL] (2005) First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2005) — Granada (Spain)