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Displaying 22 results.
    • Journal article
    Nanowire-decorated microscale metallic electrodes.
    Vlad, Alexandru[UCL] Mátéfi-Tempfli, Mária[UCL] Antohe, Vlad[UCL] Faniel, Sébastien[UCL] Reckinger, Nicolas[UCL] Olbrechts, Benoit[UCL] Crahay, André[UCL] Bayot, Vincent[UCL] Piraux, Luc[UCL] Melinte, Sorin[UCL] Mátéfi-Tempfli, Stefan[UCL] (2008) Small — Vol. 4, no. 5, p. 557-560 (2008)
    • Journal article
    Process Optimization and Downscaling of a Single-Electron Single Dot Memory
    Krzeminski, Christophe Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] Dubois, Emmanuel (2009) IEEE Transactions on Nanotechnology — Vol. 8, no. 6, p. 737-748 (2009)
    • Speech
    Self-aligned single-electron memories
    Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] Dubois, Emmanuel Krzeminski, C. Villaret, A. Bensahel, D. (2005) 15th NID Workshop 2005 — Madrid (Spain)
    • Speech
    A Monte Carlo investigation of carrier transport in fabricated back-to-back Schottky diodes: influence of direct quantum tunneling and temperature
    Pascual, E. Rengel, R. Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Dubois, Emmanuel Martin, M.J. (2007) 15th International Conference on Nanoequilibrium Carrier Dynamics in Semiconductors (HCTS-15) — Tokyo (Japan)
    • Speech
    Optimisation and simulation of an alternative nano-flash memory: the SASEM device
    Krzeminski, A. Dubois, Emmanuel Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Crahay, André[UCL] Bayot, Vincent[UCL] (2004) MRS Fall Meeting 2004 — Boston (USA)
    • Journal article
    Fabrication and room-temperature single-charging behavior of self-aligned single-dot memory devices
    Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] Krzeminski, Christophe Dubois, Emmanuel Villaret, Alexandre Bensahel, Daniel-Camille (2006) IEEE Transactions on Nanotechnology — Vol. 5, no. 6, p. 649-656 (2006)
    • Speech
    Integration of Low Schottky Barrier Source/Drain for Advanced MOS Technology
    Dubois, Emmanuel Darrieu, Guilhem Krzeminski, C. Baie, Xavier Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] (2004) 13TH NID Workshop 2004 — Athens (Greece)
    • Journal article
    Self-aligned silicon-on-insulator nano flash memory device
    Tang, Xiaohui[UCL] Baie, X. Colinge, JP. Crahay, André[UCL] Katschmarsyj, B Scheuren, V Spote, David[UCL] Reckinger, Nicolas[UCL] Van de Wiele, F. Bayot, Vincent[UCL] (2000) Solid-State Electronics — Vol. 44, no. 12, p. 2259-2264 (2000)
    • Speech
    Simulation et optimisation d'une mémoire flash nanométrique
    Krzeminski, C. Dubois, Emmanuel Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Crahay, André[UCL] Bayot, Vincent[UCL] (2004) Journées Nationales Nanoélectronique — Aussois (France)
    • Speech
    Controlled growth of single nanowires within a supported alumina template: towards circuit integration
    Vlad, Alexandru[UCL] Matefi-Tempfli, M. Antohe, Vlad[UCL] Faniel, Sébastien[UCL] Crahay, André[UCL] Reckinger, Nicolas[UCL] Olbrechts, B. [UCL] Bayot, Vincent[UCL] Piraux, Luc[UCL] Matefi-Tempfli, S. Melinte, Sorin[UCL] (2007) European Materials Research Society Spring Meeting — Strasbourg, France
    • Speech
    Imaging and tuning electron transport inside nanodevices
    Toussaint, Sébastien[UCL] Brun-Barrière, Boris[UCL] Cabosart, Damien Felten, A. Reckinger, Nicolas[UCL] Iordanescu, Andra-Gabriela[UCL] Martins, Federico Faniel, Sébastien[UCL] Pala, Marco Wallart, X. Desplanque, L. Sellier, H. Huant, S. Bayot, Vincent[UCL] Hackens, Benoît[UCL] (2017) 20e Forum des microscopies à sondes locales — Juvignac
    • Speech
    Self-aligned single-electron memories: towards single-electron operation of MOS compatible nano-flash memory devices
    Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] Dubois, Emmanuel Krzeminski, C. (2005) SINANO-ESSDERC Workshop 2005 — Grenoble (France)
    • Speech
    Charge Trapping Phenomena in Single Electron NVM SOI Devices Fabricated by a Self-Aligned Quantum Dot Technology
    Nazarov, A.N. Lysenko, V.S. Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] (2006) NATO Advanced Research Workshop — Kiev (Ukraine)
    • Speech
    Recent advances in metallic source-drain engineering
    Knoch, J. Dubois, Emmanuel Larrieu, Guillaume Breil, N. Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] (2005) SINANO-ESSDERC Workshop 2005 — Grenoble (France)
    • Speech
    SOI nano device fabrication
    Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] (2004) NATO Advanced Research Workshop on Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment 2004 — Kiev (Ukraine)
    • BookChapter
    Fabrication of SOI nano devices
    Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] (2005) Science and Technology of Semiconductor-on-Insulator Structures and Devices Operating in a Harsh Environment —
    • BookChapter
    Charge trapping phenomena in single electron NVM SOI devices fabricated by a self-aligned quantum dot technology
    Nazarov, Alexei Lysenko, V.S. Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] (2007) Nanoscaled semiconductor-on-insulator structures and devices — [ISBN : 978-1-4020-6378-7]
    • Journal article
    An electrical evaluation method for the silicidation of silicon nanowires
    Tang, Xiaohui[UCL] Flandre, Denis[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] Dubois, Emmanuel Yarekha, D. A. Larrieu, Guilhem Lecestre, A. Ratajczak, J. Breil, N. Passi, Vikram[UCL] Raskin, Jean-Pierre[UCL] (2009) Applied Physics Letters — Vol. 95, no. 2 (2009)
    • Journal article
    Schottky barrier lowering with the formation of crystalline Er silicide on n-Si upon thermal annealing
    Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Yarekha, Dmitri A. Dubois, Emmanuel Godey, Sylvie Wallart, Xavier Larrieu, Guilhem Laszcz, Adam Ratajczak, Jacek Jacques, Pascal[UCL] Raskin, Jean-Pierre[UCL] (2009) Applied Physics Letters — Vol. 94, no. 19 (2009)
    • Journal article
    A Simple Method for Measuring Si-Fin Sidewall Roughness by AFM
    Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Reckinger, Nicolas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Dubois, Emmanuel Nysten, Bernard[UCL] (2009) IEEE Transactions on Nanotechnology — Vol. 8, no. 5, p. 611-616 (2009)
    • Journal article
    Characterization of ultrathin SOI film and application to short channel MOSFETs
    Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Larrieu, Guilhem Dubois, Emmanuel Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Nysten, Bernard[UCL] Jonas, Alain M.[UCL] Bayot, Vincent[UCL] (2008) Nanotechnology — Vol. 19, no. 16, p. 165703 (2008)
    • Journal article
    Low Schottky barrier height for ErSi2−x/n-Si contacts formed with a Ti cap
    Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Yarekha, Dmitri A. Dubois, E. Godey, Sylvie Wallart, Xavier Larrieu, Guilhem Laszcz, Adam Ratajczak, J. Raskin, Jean-Pierre[UCL] (2008) Journal of Applied Physics — Vol. 104, no. 10, p. 103523 (2008)