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1. • Patent

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   Imposing and determining stress in sub-micron samples

   Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] Carbonnelle, Pierre[UCL] Gravier , Sébastien (2008)
2. • Journal article

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   High-Temperature DC and RF behaviors of Partially-Depleted SOI MOSFET transistors

   Emam, M. Tinoco, C. Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2008) Solid-State Electronics — Vol. 52, no.12, p. 1924-1932 (2008)
3. • Journal article

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   Linearity analysis in Double Gate Graded-Channel SOI devices applied to 2-MOS MOSFET-C balanced structures

   Doria, R. T. Cerdeira, A. Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Pavanello, M. A. (2008) ECS Transactions — Vol. 14, p. 273-282 (2008)
4. • Journal article

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   Low Schottky barrier height for ErSi2−x/n-Si contacts formed with a Ti cap

   Reckinger, N. Tang, Xiaohui[UCL] Dubois, E. Godey, S. Wallart, X. Raskin, Jean-Pierre[UCL] (2008) Journal of Applied Physics — Vol. 104, no.10, p. 103523 (2008)
5. • Journal article

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   High-Frequency Noise Performance of 60-nm Gate-Length FinFETs

   Raskin, Jean-Pierre[UCL] Pailloncy, Guillaume Lederer, Dimitri Danneville, Francois Dambrine, Gilles Decoutere, Stefaan[UCL] Mercha, Abdelkarim[UCL] Parvais, Bertrand[UCL] (2008) IEEE Transactions on Electron Devices — Vol. 55, no. 10, p. 2718-2727 (2008)
6. • Journal article

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   Temperature behavior of spiral inductors on high resistivity substrate in SOI CMOS technology

   El Kaamouchi, Majid[UCL] Delatte, Pierre[UCL] Moussa, M. Si[UCL] Raskin, Jean-Pierre[UCL] Vanhoenacker-Janvier, Danielle[UCL] (2008) Solid-State Electronics — Vol. 52, no. 12, p. 1915-1923 (2008)
7. • Speech

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   High-temperature DC and RF behaviors of partially-depleted SOI MOSFET transistors

   Emam, Mostafa[UCL] Tinoco, J.[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2008) EUROSOI - 2008, Fourth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits — Tyndall National Institute, Cork, Ireland
8. • Journal article

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   RF performance of a commercial SOI technology transferred onto a passivated HR silicon substrate

   Lederer, Dimitri Raskin, Jean-Pierre[UCL] (2008) IEEE Transactions on Electron Devices — Vol. 55, no. 7, p. 1664-1671 (2008)
9. • Journal article

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   Harmonic distortion analysis of double gate graded-channel MOSFETs operating in saturation

   Doria, Rodrigo Trevisoli Cerdeira, Antonio Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Pavanello, Marcelo Antonio (2008) Microelectronics — Vol. 39, no. 12, p. 1663-1670 (2008)
10. • Journal article

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    Fabrication and Characterization of High Resistivity SOI Wafers for RF Applications

    Lederer, Dimitri[UCL] Roda Neve, Cesar[UCL] Olbrechts, Benoit[UCL] Raskin, Jean-Pierre[UCL] (2008) ECS Transactions — Vol. 16, no. 8, p. 165-174 (2008)
11. • Journal article

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    RF small-signal analysis of Schottky-barrier p-MOSFET

    Valentin, Raphael Dubois, Emmanuel Raskin, Jean-Pierre[UCL] Larrieu, Guilhem Dambrine, Gilles Lim, Tao Chuan Breil, Nicolas Danneville, Francois (2008) IEEE Transactions on Electron Devices — Vol. 55, no. 5, p. 1192-1202 (2008)
12. • Journal article

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    Characterization of ultrathin SOI film and application to short channel MOSFETs

    Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Larrieu, Guilhem Dubois, Emmanuel Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Nysten, Bernard[UCL] Jonas, Alain M.[UCL] Bayot, Vincent[UCL] (2008) Nanotechnology — Vol. 19, no. 16, p. 165703 (2008)
13. • Journal article

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    A 7-dB 43-GHz CMOS distributed amplifier on high-resistivity SOI substrates

    Pavageau, Christophe Moussa, Mehdi Si[UCL] Raskin, Jean-Pierre[UCL] Vanhoenacker-Janvier, Danielle[UCL] Fel, Nicolas Russat, Jean Picheta, Laurence Danneville, Francois (2008) IEEE Transactions on Microwave Theory and Techniques — Vol. 56, no. 3, p. 587-598 (2008)
14. • Journal article

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    Silicon-on-Nothing MOSFETs: An efficient solution for parasitic substrate coupling suppression in SOI devices

    Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2008) Applied Surface Science — Vol. 254, no. 19, p. 6168-6173 (2008)
15. • Journal article

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    NANOSIL network of excellence-silicon-based nanostructures and nanodevices for long-term nanoelectronics applications

    Balestra, F. Parker, E. Leadley, D.L. Mantl, S. Dubois, E. Engstrom, o. Clerc, R Cristoloveanu, Sorin Kurz, H. Raskin, Jean-Pierre[UCL] Lemme, M. Ionescu, A. Kasper, E. Karmous, A. Baus, M. Spangenberg, B. Ostling, M. Sangiorgi, E. Ghibaudo, G. Flandre, Denis[UCL] (2008) Materials Science in Semiconductor Processing — Vol. 11, no. 5-6, p. 148-159 (2008)
16. • Speech

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    MIMC reliability and electrical behavior defined by a physical layer property of the dielectric

    Ackaert, J. Charavel, Rémy[UCL] Dhondt, K. Vlachakis, B. De Schepper, L. Millecam, M. Vandevelde, E. Bogaert, Patrick Iline, A. De Backer, Emile[UCL] Vlad, Alexandru[UCL] Raskin, Jean-Pierre[UCL] (2008) 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis — Maastricht(Netherlands)
17. • Journal article

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    MIMC Reliability and Electrical Behavior Defined by a Physical Layer Property of the Dielectric

    Charavel, Rémy[UCL] Ackaert, J. Dhondt, K. Vlachakis, B. De Schepper, L. Millecam, M. Vandevelde, Eddy Bogaert, Pierre[UCL] De Backer, E. Ilin, Anton[UCL] Vlad, Alexandru[UCL] Raskin, Jean-Pierre[UCL] (2008) ECS Transactions — Vol. 13, no. 2, p. 83-90 (February 2008)
18. • Journal article

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    Out-of-plane topography of 3-D surface micromachined micro-sensors

    André, Nicolas[UCL] Sobieski, Stanislas[UCL] Francis, Laurent[UCL] Raskin, Jean-Pierre[UCL] (2008) Polytec InFocus - Optical Measurement Solutions — no. 2, p. 22-23 (February 2008)
19. • Journal article

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    High-frequency performance of Schottky Barrier p-MOSFET devices

    Raskin, Jean-Pierre[UCL] Pearman, D.J. Pailloncy, Guillaume[UCL] Larson, J.M. Snyder, J. Leadley, D.L. Whall, T.E. (2008) IEEE Electronic Device Letters — Vol. 29, no. 4, p. 396-398 (April 2008)
20. • Journal article

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    Reduction of Photo-Induced excess carriers in optically controlled microwave circuits on HR-Si

    Roda Neve, Cesar[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2008) Proceedings of the European Microwave Association — Vol. 4, p. 199-205 (June 2008)
21. • Journal article

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    Low Schottky barrier height for ErSi2−x/n-Si contacts formed with a Ti cap

    Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Yarekha, Dmitri A. Dubois, E. Godey, Sylvie Wallart, Xavier Larrieu, Guilhem Laszcz, Adam Ratajczak, J. Raskin, Jean-Pierre[UCL] (2008) Journal of Applied Physics — Vol. 104, no. 10, p. 103523 (2008)
22. • Speech

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    Comparison of Digital Substrate Noise in SOI and Bulk Si CMOS Technologies

    Roda Neve, C. Bol, David[UCL] Ambroise, R. Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2008) 7th Workshop on Low-Voltage Low Power Design — Louvain-la-Neuve (Belgium)
23. • Speech

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    Wireless microsensors system for monitoring breathing activity

    André, N. Gérard, Pierre[UCL] Drochmans, P. Kezai, T. Druart, S. Moreno-Hagelsieb, L. Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2008) European Medical and Biological Engineering Congress – Engineering for Health – EMBEC’08 — Antwerp (Belgium)
24. • Speech

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    Silicon Nanowires for Biosensors

    Dutu, C. A. Vlad, A. Gence, L. Raskin, Jean-Pierre[UCL] Melinte, Sorin[UCL] (2008) 9th International Balkan Workshop on Applied Physics – IBWAP’08 — Constanta (Romania)
25. • Speech

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    The effect of a SiO2 interface on RF harmonic distortion in CPW lines on silicon or passivated silicon

    Kerr, D. C. Gering, J. M. McKay, T. Carroll, S. Roda Neve, C. Raskin, Jean-Pierre[UCL] (2008) The 8th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF’08 — Orlando, FL (USA)

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