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1. • Journal article

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   Experimental study of transconductance and mobility behaviors in ultrathin SOI MOSFETs with standard and thin buried oxides

   Rudenko, T. Kilchytska, Valeriya[UCL] Burignat, S. Raskin, Jean-Pierre[UCL] Andrieu, F. Faynot, O. Le Tiec, Y. Landry, K. Nazarov, A. Lysenko, V. S. Flandre, Denis[UCL] (2010) Solid-State Electronics — Vol. 54, p. 164-170 (2010)
2. • Journal article

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   Behaviour of CPW and TFMS lines at high temperature for RF applications in sub-45 nm nodes

   Roda Neve, C. Farci, A. Gallitre, M. Blampey, B. Meuris, P. Arnaud, L. Raskin, Jean-Pierre[UCL] (2010) Microelectronics Journal — Vol. 87, no.3, p. 324-328 (2010)
3. • Journal article

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   Substrate impact on threshold voltage and subthreshold slope of sub-32 nm Ultra Thin SOI MOSFETs with thin Buried Oxide and undoped channel

   Burignat, S. Flandre, Denis[UCL] Md Arshad, M. K. Kilchytska, Valeriya[UCL] Andrieux, F. Faynot, O. Raskin, Jean-Pierre[UCL] (2010) Solid-State Electronics — Vol. 54, p. 213-219 (2010)
4. • Journal article

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   Dynamic pressure as a measure of gas turbine engine (GTE) performance

   Rinaldi, G. Stiharu, I. Packirisamy, M. Nerguizian, V. Landry, R. Jr Raskin, Jean-Pierre[UCL] (2010) Measurement Science and Technology — Vol. 21, no. 4 (2010)
5. • Journal article

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   Radio-Frequency Study of Dopant-Segregated n-Type SB-MOSFETs on Thin-Body SOI

   Urban, Christoph Emam, Mostafa[UCL] Sandow, Christian Knoch, Joachim Zhao, Qing-Tai Raskin, Jean-Pierre[UCL] Mantl, Siegfried (2010) IEEE Electron Device Letters — Vol. 31, no. 6, p. 537-539 (2010)
6. • Journal article

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   Thermal Noise in MOSFETs: A Two- or a Three-Parameter Noise Model?

   Emam, Mostafa[UCL] Sakalas, Paulius Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] Lim, Tao Chuan Danneville, Francois (2010) IEEE Transactions on Electron Devices — Vol. 57, no. 5, p. 1188-1191 (2010)
7. • Journal article

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   Ductility of thin metallic films

   Pardoen, Thomas[UCL] Coulombier, Michaël[UCL] Boe, Alexandre[UCL] Safi, A. Brugger, Charles[UCL] Ryelandt, Sophie[UCL] Carbonnelle, Pierre[UCL] Gravier, Sébastien[UCL] Raskin, Jean-Pierre[UCL] (2010) Materials Science Forum — Vol. 633-634, p. 615-635 (2010)
8. • Journal article

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   Accurate prediction of the volume inversion impact on undoped Double Gate MOSFET capacitances

   Moldovan, O. Chaves, F.A. Jime nez, D. Raskin, Jean-Pierre[UCL] Iniguez, B. (2010) International Journal of Numerical Modelling: Electronic Networks, Devices and Fields — Vol. 23, no. 6, p. 447-457 (2010)
9. • Speech

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   Efficient polysilicon passivation layer for crosstalk reduction in high-resistivity SOI substrates

   Ben Ali, Khaled[UCL] Roda Neve, Cesar[UCL] Gharsallah, A. Raskin, Jean-Pierre[UCL] (2010) 2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2010) — New Orleans, LA, USA
10. • Speech

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    Imperfection and size dependent fracture of thin metallic films

    Pardoen, Thomas[UCL] Coulombier, Michaël[UCL] Boé, A. Brugger, Charles[UCL] Colla, Marie-Stéphane[UCL] Delannay, Laurent[UCL] Dancette, Sylvain[UCL] Idrissi, Hosni Wang, B. Schryvers, D. Massart, T.J. Raskin, Jean-Pierre[UCL] (2010) Fifth International Conference on Multiscale Materials Modeling - MMM2010 — Freiburg, Germany
11. • Speech

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    Application of process induced stress to study the mechanical properties of monocrystalline and amorphous silicon thin films

    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2010) Nanomechanical Testing Workshop and Hysitron User Meeting — INM, Saarbrücken, Germany
12. • Journal article

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    Imperfection-sensitive ductility of aluminium thin films

    Coulombier, Michaël[UCL] Boe, Alexandre[UCL] Brugger, C.[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2010) Scripta Materialia — Vol. 62, no. 10, p. 742-745 (2010)
13. • Journal article

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    Strain gradient plasticity analysis of the strength and ductility of thin metallic films using an enriched interface model

    Brugger, Charles[UCL] Coulombier, Michaël[UCL] Massart, T. J. Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2010) Acta Materialia — Vol. 58, no. 15, p. 4940-4949 (2010)
14. • Journal article

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    Mobility improvement in nanowire junctionless transistors by uniaxial strain

    Raskin, Jean-Pierre[UCL] Colinge, Jean-Pierre Ferain, Isabelle Kranti, Abhinav Lee, Chi-Woo Akhavan, Nima Dehdashti Yan, Ran Razavi, Pedram Yu, Ran (2010) Applied Physics Letters — Vol. 97, no. 4 (2010)
15. • Speech

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    Quasi-optical technique for sensing bond quality of silicon wafer

    Elhawil, Amna Huynen, Isabelle[UCL] Raskin, Jean-Pierre[UCL] Roda Neve, Cesar[UCL] Stiens, Johan Vounckx, Roger (2010) SPIE Photonics Europe (Micro Optics) — Brussels, Belgium
16. • Speech

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    SOI technology : an opportunity for RF designers?

    Raskin, Jean-Pierre[UCL] (2010) 40th European Solid-State Device Research Conference – ESSDERC’10 - ESSDERC Tutorial on Silicon-on-Insulator: from materials to circuit design — Seville, Spain
17. • Speech

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    Backgate bias and stress level impact on giant piezoresistance effect in thin silicon films and nanowires

    Passi, Vikram[UCL] Ravaux, F. Dubois, Emmanuel[UCL] Raskin, Jean-Pierre[UCL] (2010) 23rd IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2010) — Wanchai, Hong Kong, China
18. • Speech

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    RF Compact Small-Signal Model for SOI DG-MOSFETs

    Cerdeira, A. Tinoco, J.C. Estrada, M. Raskin, Jean-Pierre[UCL] (2010) 2010 27th International Conference on Microelectronics (MIEL 2010) — Nis, Serbia
19. • Speech

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    Performance of low-pass filter based on non-uniform capacitor sections

    Oueriemi, Ibtissem[UCL] Choubani, F. Huynen, Isabelle[UCL] Raskin, Jean-Pierre[UCL] (2010) 2010 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2010) — Hammamet, Tunisia
20. • Speech

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    TEM characterization of twinned nanocrystalline palladium thin films

    Idrissi, H. Wang, B. Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Schrijvers, D. Pardoen, Thomas[UCL] (2010) 2010 Materials Research Society Fall Meeting - MRS Fall'10 — Boston, MA, USA
21. • Speech

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    Graded Channel concept used to improve RF noise of an industrial 0.15 µm SOI CMOS technology

    Emam, Mostafa[UCL] Sakalas, P.[UCL] Kumar, A.[UCL] Ida, J.[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] Danneville, François[UCL] (2010) The 5th European Microwave Integrated Circuits Conference - EuMIC’10 — Paris, France
22. • Speech

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    Mechanical properties characterization of freestanding palladium films by on-chip internal stress controlled nanomechanical tensile testing

    Colla, Marie-Stéphane[UCL] Coulombier, Michaël[UCL] Boé, A. Idrissi, H. Wang, B. Schrijvers, D. Proost, Joris[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2010) Nanobrucken Nanomechanical testing Workshop, INM — Saarbrucken - Germany
23. • Speech

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    Quasi-optical technique for sensing bond quality of silicon wafers

    Elhawil, A. Huynen, Isabelle[UCL] Raskin, Jean-Pierre[UCL] Roda Neve, Cesar[UCL] Olbrechts, Benoit[UCL] Stiens, J. Vounckx, R. (2010) Micro-Optics 2010 — Brussels, Belgium
24. • Speech

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    New RF Intrinsic Parameters Extraction Procedure for Advanced MOS Transistors

    Tinoco, J.C. Martinez-Lopez, A.G. Emam, Mostafa[UCL] Raskin, Jean-Pierre[UCL] (2010) 2010 23rd IEEE ICMTS International Conference on Microelectronic Test Structures (ICMTS 2010) — Hiroshima, Japan
25. • Journal article

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    Small-signal analysis of high-performance of p- and n-type SOI SB-MOSFETs with dopant segregation

    Urban, C. Emam, Mostafa[UCL] Sandow, C. Zhao, Q.T. Fox, A. Mantl, S. Raskin, Jean-Pierre[UCL] (2010) Solid-State Electronics — Vol. 54, no. 9, p. 877-882 (September 2010)

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