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1. • Journal article

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   Impact of substrate resistivity on spiral inductors at mm-wave frequencies

   Nyssens, Lucas[UCL] Rack, Martin[UCL] Schwan, Christophe Zhao, Zhixing Lehmann, Steffen Hermann, Tom Allibert, Frederic Aulnette, Cécile Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2022) Solid-State Electronics — Vol. 194 (2022)
2. • Journal article

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   Double Buried Oxide Trap-Rich Substrates for High Frequency Applications

   Nabet, Massinissa[UCL] Rack, Martin[UCL] Yan, Yiyi[UCL] Nguyen, Bich-Yen Raskin, Jean-Pierre[UCL] (2023) IEEE Electron Device Letters — , p. 1-1 (2023)
3. • Journal article

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   In-situ TEM irradiation creep experiment revealing radiation induced dislocation glide in pure copper

   Khiara, Nargisse Onimus, Fabien Jublot-Leclerc, Stéphanie Jourdan, Thomas Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] Bréchet, Yves (2021) Acta Materialia — Vol. 216, p. 117096 (2021)
4. • Journal article

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   Low-Power Silicon Strain Sensor Based on CMOS Current Reference Topology

   Roisin, Nicolas[UCL] Delhaye, Thibault[UCL] André, Nicolas[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Low-Power Silicon Strain Sensor Based on CMOS Current Reference Topology — Vol. 339, no.113491, p. 1-11 (2022)
5. • Journal article

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   Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors

   Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Bin, Wang Faniel, Sébastien[UCL] Zeng, Yun Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Microelectronic Engineering — Vol. 254, no.111708, p. 7 (2022)
6. • Journal article

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   Variation Range of Different Inductor Topologies with Shields for RF and Inductive Sensing Applications

   Tounsi, Fares[UCL] Hadj Said, Mohamed Hauwaert, Margo[UCL] Kaziz, Sinda Francis, Laurent[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Sensors — Vol. 22, no.9, p. 15 (2022)
7. • Journal article

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   Experimental study of thermal coupling effects in FD-SOI MOSFET

   Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2022) Solid-State Electronics — Vol. 194, no.108362, p. 4 (2022)
8. • Journal article

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   Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications

   Kilchytska, Valeriya[UCL] Makovejev, Sergej Esfeh, Babak Kazemi Nyssens, Lucas[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) I E E E Journal of the Electron Devices Society — Vol. 9, p. 500-510 (2021)
9. • Journal article

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   Novel class of nanostructured metallic glass films with superior and tunable mechanical properties

   Ghidelli, Matteo Orekhov, Andrey[UCL] Bassi, A. Li Terraneo, G. Djemia, P. Abadias, G. Nord, M. Béché, A. Gauquelin, N. Verbeeck, J. Raskin, Jean-Pierre[UCL] Schryvers, Dominique Pardoen, Thomas[UCL] Idrissi, Hosni[UCL] (2021) Acta Materialia — Vol. 213, p. 116955 (2021)
10. • Journal article

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    Indirect light absorption model for highly strained silicon infrared sensors

    Roisin, Nicolas[UCL] Brunin, Guillaume[UCL] Rignanese, Gian-Marco[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2021) Journal of Applied Physics — Vol. 30, no.5, p. 30 (2021)
11. • Journal article

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    Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) Solid-State Electronics — Vol. 194, p. 4 (2022)
12. • Journal article

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    Improved Split CV Mobility Extraction in 28 nm Fully Depleted Silicon on Insulator Transistors

    Morelle, Alban Vandermolen, Eric Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) IEEE Electron Device Letters — Vol. 42, no.5, p. 661-664 (2021)
13. • Journal article

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    Probe-Dependent Residual Error Analysis for Accurate On-Wafer MOSFET Measurements up to 110 GHz

    L. Nyssens Ma, Shiqi[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Journal of the Electron Devices Society — Vol. 11, no.11, p. 650 - 657 (2023)
14. • Journal article

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    On the Separate Extraction of Self-Heating and Substrate Effects in FD-SOI MOSFET

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2021) IEEE Electron Device Letters — Vol. 42, no.5, p. 665-668 (2021)
15. • Journal article

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    Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid State Electronics — Vol. 207, no.207 (2023)
16. • Journal article

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    C-V measurement and modeling of double-BOX Trap-Rich SOI substrate

    Huang, Yang[UCL] Yan, Yiyi[UCL] Nabet, Massinissa[UCL] Liu, Fanyu Li, Bo Li, Binhong Han, Zhengsheng Nguyen, Bich-Yen Cristoloveanu, Sorin Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 209, p. 108763 (2023)
17. • Journal article

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    Contribution of Substrate Harmonic Distortion to GaN-on-Si RF Switches Linearity

    Cardinael, Pieter[UCL] Yadav, Sachin Rack, Martin[UCL] Peralagu, Uthayasankaran Alian, Alireza Parvais, Bertrand Collaert, Nadine Raskin, Jean-Pierre[UCL] (2024) IEEE Microwave and Wireless Technology Letters — Vol. 34, no.3, p. 298-301 (2024)
18. • Journal article

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    Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers

    Velosa-Moncada, Luis A. Raskin, Jean-Pierre[UCL] Aguilera-Cortés, Luz Antonio López-Huerta, Francisco Herrera-May, Agustín L. (2022) Nanomaterials — Vol. 12, no.2, p. 265 (2022)
19. • Journal article

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    A molecular dynamics study of a cascade induced irradiation creep mechanism in pure copper

    Khiara, Nargisse Onimus, Fabien Crocombette, Jean-Paul Dupuy, Laurent Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] Bréchet, Yves (2022) Journal of Nuclear Materials — Vol. 560, p. 153518 (2022)
20. • Journal article

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    Characterization and role of deep traps on the radio frequency performances of high resistivity substrates

    Vandermolen, Eric Ferrandis, Philippe Allibert, Frédéric Nabet, Massinissa[UCL] Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] Cassé, Mikaël (2021) Journal of Applied Physics — Vol. 129, no.21, p. 215701 (2021)
21. • Journal article

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    On-chip very low strain rate rheology of amorphous olivine films

    Coulombier, Michaël[UCL] Baral, Paul Orekhov, Andrey Dohmen, Ralf Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Cordier, Patrick Idrissi, Hosni[UCL] (2024) Acta Materialia — Vol. 266, p. 119693 (2024)
22. • Journal article

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    Impact of thermal coupling effects on the digital and analog figures of merit of UTBB SOI MOSFET pairs

    Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2023) Solid - State Circuits — Vol. 2023, p. 108623 (2023)
23. • Journal article

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    Band gap reduction in highly-strained silicon beams predicted by first-principles theory and validated using photoluminescence spectroscopy

    Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Scaffidi, Romain[UCL] Pardoen, Thomas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) Optical Materials — Vol. 144, no.114347, p. 1-10 (2023)
24. • Journal article

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    Potential and Modeling of 1 µm - 1 GHz SOI CMOS OTAs

    Eggermont, Jean-Pierre[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Colinge, Jean-Pierre[UCL] (1997) Electronics Letters — Vol. 33, no. 9, p. 774-775 (April)
25. • Journal article

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    Electrical Characterization of Cellulose-Based Membranes towards Pathogen Detection in Water

    Le Brun, Grégoire[UCL] Hauwaert, Margo[UCL] Leprince, Audrey[UCL] Glinel, Karine[UCL] Mahillon, Jacques[UCL] Raskin, Jean-Pierre[UCL] (2021) Biosensors — Vol. 11, no.2, p. 57 (2021)

Pages