User menu

Accès à distance ? S'identifier sur le proxy UCLouvain

Search

Displaying 4 results.
    • Journal article
    Measurement and modeling of thin-film accumulation-mode SOI p-MOSFET intrinsic gate capacitances
    Gentinne, B.[UCL] Flandre, Denis[UCL] Colinge, Jean-Pierre[UCL] (1996) Solid-State Electronics — Vol. 39, no. 7, p. 1071-1078 (1996)