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Displaying 1 - 25 of 284 results.

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    • Journal article
    A dynamic study for wafer-level bonding strength uniformity in low-temperature wafer bonding
    Zhang, XX Raskin, Jean-Pierre[UCL] (2005) Electrochemical and Solid-State Letters — Vol. 8, no. 10, p. G268-G270 (2005)
    • BookChapter
    Impact of a High-resistivity Substrate on RF and mm-wave Performance of 22 nm FD-SOI Devices and Circuits
    Rack, Martin;[UCL] Nyssens, Lucas;[UCL] Nabet, Massinissa[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Technologies Enabling Future Mobile Connectivity & Sensing — [ISBN : 9781032633039]
    • BookChapter
    Some mitigations for unequal data variance in linear regression
    Dupuis, Pascal[UCL] Van Overstraeten, Nancy[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2012) Advanced Mathematical and Computational Tools in Metrology and Testing IX — [ISBN : 978-981-4397-94-0]
    • BookChapter
    Les techniques pédagogiques critiques de l’éducation à la citoyenneté mondiale
    Merle, Stéphanie[UCL] Raskin, Jean-Pierre[UCL] (2022) Manuel d'éducation à la citoyenneté mondiale Une perspective belge — [ISBN : 978-2-39061-248-3]
    • BookChapter
    Temperature dependence of RF losses in HR SOI substrates
    Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2005) Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environmen — [ISBN : 978-1-4020-3012-3]
    • Journal article
    Potential and Modeling of 1 µm - 1 GHz SOI CMOS OTAs
    Eggermont, Jean-Pierre[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Colinge, Jean-Pierre[UCL] (1997) Electronics Letters — Vol. 33, no. 9, p. 774-775 (April)
    • Journal article
    Electrodes-oxide-semiconductor device for biosensing: Renewed conformal analysis and multilayer algorithm
    Pampin, Rémi[UCL] Raskin, Jean-Pierre[UCL] Huynen, Isabelle[UCL] Flandre, Denis[UCL] (2020) Journal of Electroanalytical Chemistry — Vol. 856, p. 113651 (2020)
    • BookChapter
    Modeling and Characterization of TSV-Induced Noise Coupling
    Sun, Xiao Rack, Martin[UCL] Van der Plas, Geert Raskin, Jean-Pierre[UCL] Beyne, Eric (2017) Noise Coupling in System-on-Chip — [ISBN : 9781498796774]
    • Journal article
    Impact of extrinsic capacitances on FinFETs RF performance
    Tinoco, Julio Rodriguez, Silvestre Salas Martinez-Lopez, Andrea G. Alvarado, Joaquin Raskin, Jean-Pierre[UCL] (2013) IEEE Transactions on Microwave Theory and Techniques — Vol. 16, no.2, p. 833-840 (February 2013)
    • Journal article
    A novel design method for compact UWB bandpass filters
    Taibi, Abdelkader Trabelsi, Mohamed Sliman, Abdelhalim Belaroussi, Mohand Tahar Raskin, Jean-Pierre[UCL] (2015) IEEE Microwave and Wireless Components Letters — Vol. 25, no.1, p. 4-6 (January 2015)
    • Journal article
    Mechanical characterization and modelling of Lorentz force based MEMS magnetic field sensors
    Gkotsis, Petros[UCL] Castro, Lara Lopez-Huerta, F. Herrera-May, A.L. Raskin, Jean-Pierre[UCL] (2015) Solid-State Electronics — Vol. 112, no.Special Issue EuroSOI’14, p. 68-77 (October 2015)
    • Journal article
    Raman measurements of uniaxial strain in silicon nanostructures
    Urena, Ferran Olsen, Sarah H. Raskin, Jean-Pierre[UCL] (2013) Journal of Applied Physics — Vol. 114, no.14 (October 2013)
    • Journal article
    RF modeling of 40-nm triple-gate SOI FinFET
    Martinez-Lopez, A.G. Cerdeira, Antonio Tinoco, Julio C. Alvarado, J. Padron, W.Y. Mendoza, C. Raskin, Jean-Pierre[UCL] (2015) International Journal of Numerical Modelling: Electronic Networks, Devices and Fields — Vol. 28, p. 465-478 (January 2015)
    • Journal article
    A Quasi-Static Model of Silicon Substrate Effects in Graphene Field Effect Transistors
    Haddad, Pierre-Antoine[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2017) IEEE Electron Device Letters — Vol. 38, no.7, p. 987-990 (July 2017)
    • Journal article
    Automated Design of a 13.56 MHz 19µW Passive Rectifier With 72% Efficiency Under 10µA load
    Haddad, Pierre-Antoine[UCL] Gosset, Geoffroy Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2016) IEEE Journal of Solid State Circuits — Vol. 51, no.5, p. 12 (05/2015)

Pages