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Displaying 1 - 25 of 230 results.

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    • Speech
    In-situ recovery of on-membrane PD-SOI MOSFET from TID defects after gamma irradiation
    Amor, Sedki[UCL] Kilchytska, Valeriya[UCL] Tounsi, Fares[UCL] André, Nicolas[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2021) 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) — Caen, France
    • Journal article
    Trap Recovery by in-Situ Annealing in Fully-Depleted MOSFET With Active Silicide Resistor
    Amor, Sedki[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Galy, Philippe (2021) IEEE Electron Device Letters — Vol. 42, no.7, p. 1085-1088 (2021)
    • Speech
    Compact Model for Single Event Transients and Total Dose Eects at High Temperatures for Partially Depleted SOI MOSFETs
    Alvarado Pulido, José Joaquin[UCL] Kilchytska, Valeriya[UCL] Boufouss, El Hafed[UCL] Flandre, Denis[UCL] (2010) 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2010) — Gaeta
    • Speech
    Characterization of Carrier Generation in Thin-Film SOI Devices by Reverse Gated-Diode Technique and Its Application at High Temperatures
    Rudenko, Tamara Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2004) NATO Advanced Research Workshop - Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment — Kyiv (Ukraine)
    • Journal article
    Effect of high-energy neutrons on MuGFETs
    Kilchytska, Valeriya[UCL] Alvarado Pulido, José Joaquin[UCL] Collaert, N. Rooyakers, R. Militaru, Otilia[UCL] Berger, G.[UCL] Flandre, Denis[UCL] (2010) Solid-State Electronics — Vol. 54, p. 196-204 (2009)
    • Speech
    Experimental study of thermal coupling effects in FD-SOI MOSFET
    Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
    • Speech
    Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks
    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
    • Journal article
    Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors
    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Bin, Wang Faniel, Sébastien[UCL] Zeng, Yun Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Microelectronic Engineering — Vol. 254, no.111708, p. 7 (2022)
    • Journal article
    Experimental study of thermal coupling effects in FD-SOI MOSFET
    Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2022) Solid-State Electronics — Vol. 194, no.108362, p. 4 (2022)
    • Speech
    Determination of Carrier Lifetime in Silicon Using an Ultra-thin Al2O3/SiO2 Dielectric Stack
    Yan, Yiyi[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Tang, Xiaohui[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 IEEE Latin America Electron Devices Conference (LAEDC) — Virtual conference
    • Journal article
    Review on double-gate MOSFETs and FinFETs modeling
    Cerdeira, Antonio Estrada, Magali Alvarado Pulido, José Joaquin Garduno, I. Contreras, E. Tinoco, J. Iniguez, Benjamin Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2013) Facta Universitatis. Series Electronics and Energetics — Vol. 26, no. 3, p. 197-213 (December 2013)

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