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Displaying 5 results.
    • Journal article
    An electrical evaluation method for the silicidation of silicon nanowires
    Tang, Xiaohui[UCL] Flandre, Denis[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] Dubois, Emmanuel Yarekha, D. A. Larrieu, Guilhem Lecestre, A. Ratajczak, J. Breil, N. Passi, Vikram[UCL] Raskin, Jean-Pierre[UCL] (2009) Applied Physics Letters — Vol. 95, no. 2 (2009)
    • Journal article
    Low temperature tunneling current enhancement in silicide/Si Schottky contacts with nanoscale barrier width
    Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Dubois, Emmanuel Larrieu, Guilhem Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Afzalian, Aryan[UCL] (2011) Applied Physics Letters — Vol. 98, no. 11, p. 112102 (16 March 2011)
    • Journal article
    A Simple Method for Measuring Si-Fin Sidewall Roughness by AFM
    Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Reckinger, Nicolas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Dubois, Emmanuel Nysten, Bernard[UCL] (2009) IEEE Transactions on Nanotechnology — Vol. 8, no. 5, p. 611-616 (2009)
    • Journal article
    Characterization of ultrathin SOI film and application to short channel MOSFETs
    Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Larrieu, Guilhem Dubois, Emmanuel Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Nysten, Bernard[UCL] Jonas, Alain M.[UCL] Bayot, Vincent[UCL] (2008) Nanotechnology — Vol. 19, no. 16, p. 165703 (2008)
    • Journal article
    Energy-Band Engineering for Improved Charge Retention in Fully Self-Aligned Double Floating-Gate Single-Electron Memories
    Tang, Xiaohui[UCL] Krzeminski, Christophe Lecavalier des Etangs-Levallois, Aurélien Chen, Zhenkun Dubois, Emmanuel Kasper, Erich Karmous, Alim Reckinger, Nicolas[UCL] Flandre, Denis[UCL] Francis, Laurent[UCL] Colinge, Jean-Pierre Raskin, Jean-Pierre[UCL] (2011) Nano Letters : a journal dedicated to nanoscience and nanotechnology — Vol. 11, no. 11, p. 4520-4526 (3 octobre 2011)