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Displaying 31 - 100 of 1210 results.

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    • Speech
    28 GHz Down-Conversion Mixer with RF Back-Gate Excitation Topology in 22-nm FD-SOI
    Nabet, Massinissa[UCL] Rack, Martin[UCL] Nyssens, Lucas[UCL] Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] (2022) 17th European Microwave Integrated Circuits Conference — Milan, Italy
    • Journal article
    Double Buried Oxide Trap-Rich Substrates for High Frequency Applications
    Nabet, Massinissa[UCL] Rack, Martin[UCL] Yan, Yiyi[UCL] Nguyen, Bich-Yen Raskin, Jean-Pierre[UCL] (2023) IEEE Electron Device Letters — , p. 1-1 (2023)
    • Journal article
    Low-Power Silicon Strain Sensor Based on CMOS Current Reference Topology
    Roisin, Nicolas[UCL] Delhaye, Thibault[UCL] André, Nicolas[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Low-Power Silicon Strain Sensor Based on CMOS Current Reference Topology — Vol. 339, no.113491, p. 1-11 (2022)
    • Journal article
    Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors
    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Bin, Wang Faniel, Sébastien[UCL] Zeng, Yun Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Microelectronic Engineering — Vol. 254, no.111708, p. 7 (2022)
    • Journal article
    Experimental study of thermal coupling effects in FD-SOI MOSFET
    Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2022) Solid-State Electronics — Vol. 194, no.108362, p. 4 (2022)
    • Journal article
    Indirect light absorption model for highly strained silicon infrared sensors
    Roisin, Nicolas[UCL] Brunin, Guillaume[UCL] Rignanese, Gian-Marco[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2021) Journal of Applied Physics — Vol. 30, no.5, p. 30 (2021)
    • Speech
    Determination of Carrier Lifetime in Silicon Using an Ultra-thin Al2O3/SiO2 Dielectric Stack
    Yan, Yiyi[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Tang, Xiaohui[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 IEEE Latin America Electron Devices Conference (LAEDC) — Virtual conference
    • Speech
    Sub-ppm detection of H2S with CuO-loaded SnO2 hollow nanospheres deposited on interdigitated electrodes
    de Leuze, Oriane[UCL] Danlée, Yann[UCL] Tang, Xiaohui[UCL] Mahy, J. Walewyns, Thomas[UCL] Raskin, Jean-Pierre[UCL] Hermans, Sophie[UCL] Francis, Laurent[UCL] (2022) ISOEN 2022 - International Symposium on Olfaction and Electronic Nose — Aveiro (Portugal)
    • Journal article
    Probe-Dependent Residual Error Analysis for Accurate On-Wafer MOSFET Measurements up to 110 GHz
    L. Nyssens Ma, Shiqi[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Journal of the Electron Devices Society — Vol. 11, no.11, p. 650 - 657 (2023)
    • BookChapter
    Impact of a High-resistivity Substrate on RF and mm-wave Performance of 22 nm FD-SOI Devices and Circuits
    Rack, Martin;[UCL] Nyssens, Lucas;[UCL] Nabet, Massinissa[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Technologies Enabling Future Mobile Connectivity & Sensing — [ISBN : 9781032633039]
    • Journal article
    On the Separate Extraction of Self-Heating and Substrate Effects in FD-SOI MOSFET
    Nyssens, Lucas[UCL] Rack, Martin[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2021) IEEE Electron Device Letters — Vol. 42, no.5, p. 665-668 (2021)
    • Speech
    Sub-mmWave Transmission Lines on Silicon-Based Technologies
    Ma, Shiqi[UCL] L. Nyssens Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] (2023) 53rd European Microwave Conference — Berlin, Germany
    • Journal article
    Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack
    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid State Electronics — Vol. 207, no.207 (2023)

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