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Displaying 21 - 75 of 417 results.

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    • Journal article
    La technologie RF SOI dans 100% de nos smartphones
    Raskin, Jean-Pierre[UCL] (2016) Revue de l'Electricite et de l'Electronique — Vol. 1, p. 13-16 (2016)
    • Journal article
    Extrinsic gate capacitance compact model for UTBB MOSFETs
    Martinez-Lopez, Andrea G Tinoco, Julio C Lezama, Gamaliel Conde, Jorge E Kazemi Esfeh, Babak[UCL] Raskin, Jean-Pierre[UCL] (2018) Semiconductor Science and Technology — Vol. 33, no.1, p. 015001 (2018)
    • Journal article
    Post-process porous silicon for 5G applications
    Scheen, Gilles[UCL] Tuyaerts, Romain[UCL] Rack, Martin[UCL] Nyssens, Lucas[UCL] Rasson, J. Nabet, Massinissa[UCL] Raskin, Jean-Pierre[UCL] (2020) Solid-State Electronics — Vol. 168, p. 107719 (2020)
    • Journal article
    Wideband characterization of SOI materials and devices
    Raskin, Jean-Pierre[UCL] (2007) Solid-State Electronics — Vol. 51, p. 1161-1171 (2007)
    • Journal article
    High-Temperature DC and RF behaviors of Partially-Depleted SOI MOSFET transistors
    Emam, M. Tinoco, C. Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2008) Solid-State Electronics — Vol. 52, no.12, p. 1924-1932 (2008)
    • Journal article
    Raman analysis of strain in p-type doped silicon nanostructures
    Ureña Begara, Fernando[UCL] Vayrette, Renaud Bhaskar, Umesh Kumar Raskin, Jean-Pierre[UCL] (2018) Journal of Applied Physics — Vol. 124, no.9, p. 095102 (2018)

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