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1. • Journal article

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   Rheology of amorphous olivine thin films characterized by nanoindentation

   Baral, Paul[UCL] Orekhov, Andrey[UCL] Dohmen, Ralf Coulombier, Michaël[UCL] Raskin, Jean-Pierre[UCL] Cordier, Patrick Idrissi, Hosni[UCL] Pardoen, Thomas[UCL] (2021) Acta Materialia — Vol. 219, p. 117257 (2021)
2. • Journal article

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   Modeling of Semiconductor Substrates for RF Applications: Part I—Static and Dynamic Physics of Carriers and Traps

   Rack, Martin[UCL] Frédéric Allibert Raskin, Jean-Pierre[UCL] (2021) IEEE Transactions on Electron Devices — Vol. 68, no.9, p. 4598-4605 (2021)
3. • Journal article

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   Modeling of Semiconductor Substrates for RF Applications: Part II—Parameter Impact on Harmonic Distortion

   Rack, Martin[UCL] Frédéric Allibert Raskin, Jean-Pierre[UCL] (2021) IEEE Transactions on Electron Devices — Vol. 68, no.9, p. 4606-4613 (2021)
4. • Journal article

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   Porous silicon membranes and their applications: Recent advances

   Vercauteren, Roselien[UCL] Scheen, Gilles[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2021) Sensors and Actuators A: Physical — Vol. 318, no. 112486, p. 20 (2021)
5. • Journal article

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   On‑chip environmentally assisted cracking in thin freestanding SiO2 films

   Jaddi, Sahar[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2021) Journal of Materials Research — Vol. 36, no. 12, p. 2479-2494 (2021)
6. • Journal article

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   Could Unsustainable Electronics Support Sustainability

   Moreau, Nicolas[UCL] Pirson, Thibault[UCL] Le Brun, Grégoire[UCL] Delhaye, Thibault[UCL] Sandu, Georgiana[UCL] Paris, Antoine[UCL] Bol, David[UCL] Raskin, Jean-Pierre[UCL] (2021) Sustainability — Vol. 13, no. 6541, p. 7 (2021)
7. • Journal article

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   Accurate SOI MOSFET characterisation at microwave frequencies for device performance optimisation and analogue modeling

   Raskin, Jean-Pierre[UCL] Gillon, R. Chen, J. Vanhoenacker-Janvier, Danielle[UCL] Collinge, J.-P. (1998) IEEE Transactions on Electron Devices — Vol. 45, no.5, p. 1017-1025 (1998)
8. • Journal article

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   Electrochemical Characterization of Nitrocellulose Membranes towards Bacterial Detection in Water

   Le Brun, Grégoire[UCL] Hauwaert, Margo[UCL] Leprince, Audrey[UCL] Glinel, Karine[UCL] Mahillon, Jacques[UCL] Raskin, Jean-Pierre[UCL] (2020) Proceedings — Vol. 60, no. 1, p. 61 (2020)
9. • Journal article

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   A dynamic study for wafer-level bonding strength uniformity in low-temperature wafer bonding

   Zhang, XX Raskin, Jean-Pierre[UCL] (2005) Electrochemical and Solid-State Letters — Vol. 8, no. 10, p. G268-G270 (2005)
10. • Journal article

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    Frequency Variation of the Small-Signal Output Conductance of Decananometer MOSFETs Due to Substrate Crosstalk

    Kilchytska, Valeriya[UCL] Pailloncy, Guillaume[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] Collaert, N. Jurczak, M. Flandre, Denis[UCL] (2007) IEEE ELECTRON DEVICE LETTERS — Vol. 28, no. 5, p. 419-421 (May 2007)
11. • Journal article

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    Impact of High Temperature Up to 175 ∘ C on the DC and RF Performances of 22-nm FD-SOI MOSFETs

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Vanbrabant, Martin[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Transactions on Electron Devices — , p. 1-6 (2023)
12. • Journal article

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    Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 207, p. 108706 (2023)
13. • Journal article

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    Accurate determination of stiffness and strength of graphene via AFM-based membrane deflection

    Bahrami, Farzaneh[UCL] Malik, Mohammad Wasil[UCL] Van Loock, Frederik[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Nysten, Bernard[UCL] (2023) Measurement Science and Technology — Vol. 34, no.12, p. 125027 (2023)
14. • Journal article

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    Raman Strain-Shift Measurements and Prediction from First-Principles in Highly-Strained Silicon

    Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2023) Journal of Materials Science: Materials in Electronics — Vol. 34, p. 373 (2023)
15. • Journal article

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    Towards circular ICT: from materials to components

    Ernst, Thomas Raskin, Jean-Pierre[UCL] (2021) HiPEAC Vision 2021 — , p. 122-129 (2021)
16. • Journal article

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    The Environmental Footprint of IC Production: Review, Analysis and Lessons from Historical Trends

    Pirson, Thibault[UCL] Delhaye, Thibault P.[UCL] Pip, Alex[UCL] Brun, Gregoire Le[UCL] Raskin, Jean-Pierre[UCL] Bol, David[UCL] (2023) IEEE Transactions on Semiconductor Manufacturing — Vol. 36, p. 56-67 (2023)
17. • Journal article

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    High-resistivity with PN interface passivation in 22 nm FD-SOI technology for low-loss passives at RF and millimeter-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Schwan, C. Zhao, Z. Lhemann, S. Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 205 (2023)
18. • Journal article

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    Double Buried Oxide Trap-Rich Substrates for High Frequency Applications

    Nabet, Massinissa[UCL] Rack, Martin[UCL] Yan, Yiyi[UCL] Nguyen, Bich-Yen Raskin, Jean-Pierre[UCL] (2023) IEEE Electron Device Letters — , p. 1-1 (2023)
19. • Journal article

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    In-situ TEM irradiation creep experiment revealing radiation induced dislocation glide in pure copper

    Khiara, Nargisse Onimus, Fabien Jublot-Leclerc, Stéphanie Jourdan, Thomas Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] Bréchet, Yves (2021) Acta Materialia — Vol. 216, p. 117096 (2021)
20. • Journal article

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    Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications

    Kilchytska, Valeriya[UCL] Makovejev, Sergej Esfeh, Babak Kazemi Nyssens, Lucas[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) I E E E Journal of the Electron Devices Society — Vol. 9, p. 500-510 (2021)
21. • Journal article

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    Novel class of nanostructured metallic glass films with superior and tunable mechanical properties

    Ghidelli, Matteo Orekhov, Andrey[UCL] Bassi, A. Li Terraneo, G. Djemia, P. Abadias, G. Nord, M. Béché, A. Gauquelin, N. Verbeeck, J. Raskin, Jean-Pierre[UCL] Schryvers, Dominique Pardoen, Thomas[UCL] Idrissi, Hosni[UCL] (2021) Acta Materialia — Vol. 213, p. 116955 (2021)
22. • Journal article

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    Indirect light absorption model for highly strained silicon infrared sensors

    Roisin, Nicolas[UCL] Brunin, Guillaume[UCL] Rignanese, Gian-Marco[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2021) Journal of Applied Physics — Vol. 30, no.5, p. 30 (2021)
23. • Journal article

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    Improved Split CV Mobility Extraction in 28 nm Fully Depleted Silicon on Insulator Transistors

    Morelle, Alban Vandermolen, Eric Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) IEEE Electron Device Letters — Vol. 42, no.5, p. 661-664 (2021)
24. • Journal article

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    Probe-Dependent Residual Error Analysis for Accurate On-Wafer MOSFET Measurements up to 110 GHz

    L. Nyssens Ma, Shiqi[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Journal of the Electron Devices Society — Vol. 11, no.11, p. 650 - 657 (2023)
25. • Journal article

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    On the Separate Extraction of Self-Heating and Substrate Effects in FD-SOI MOSFET

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2021) IEEE Electron Device Letters — Vol. 42, no.5, p. 665-668 (2021)

Pages