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1. • Journal article

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   Rapid and selective detection of Staphylococcus aureus using insulated substrate impedance transducers

   Tang, Xiaohui[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Nizet, Yannick[UCL] Moreno-Hagelsieb, L. Pampin, R. Francis, Laurent[UCL] (2011) Sensors and Actuators — Vol. B, no.156, p. 578-587 (2011)
2. • Speech

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   Neutron and gamma radiation effects on MEMS structures

   Gkotsis, P. Kilchytska, Valeriya[UCL] Militaru, O. Tang, Xiaohui[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Francis, Laurent[UCL] (2011) International conference EuroSensors XXV — Athens (Greece)
3. • Speech

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   Advanced TEM analysis of deformation and growth twins in coarse and nano-grained materials

   Pardoen, Thomas[UCL] Jacques, P. J. Schryvers, D. Idrissi, Hosni[UCL] Wang B. Colla M.-S. Renard K. Raskin, Jean-Pierre[UCL] (2011) The XIVth International Conference on Electron Microscopy — Wisla, Poland
4. • Journal article

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   Neutron and gamma radiation effects on MEMS structures

   Gkotsis, Petros[UCL] Kilchytska, Valeriya[UCL] Bhaskar, Umesh Kumar[UCL] Militaru, Otilia[UCL] Tang, Xiaohui[UCL] Fragkiadakis, C. Kirby, P.B. Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Francis, Laurent[UCL] (2011) Procedia Engineering — Vol. 25, pp. 172-175 (2011)
5. • Speech

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   Extreme-environment behaviors and performances of advanced Silicon-on-Insulator CMOS sensors, transistors and circuits

   Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Alvarado Pulido, José Joaquin[UCL] Boufouss, El Hafed[UCL] Assaad, Maher[UCL] Rue, Bertrand[UCL] Roda Neve, Cesar[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2011) 2nd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA 2011) — Ghent (Belgium)
6. • BookChapter

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   Sensing and MEMS Devices in Thin-Film SOI MOS Technology

   Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2011) Semiconductor-On-Insulator Materials for Nanoelectronics Applications, Engineering Materials — [ISBN : 978-3-642-15867-4]
7. • Journal article

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   Low temperature tunneling current enhancement in silicide/Si Schottky contacts with nanoscale barrier width

   Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Dubois, Emmanuel Larrieu, Guilhem Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Afzalian, Aryan[UCL] (2011) Applied Physics Letters — Vol. 98, no. 11, p. 112102 (16 March 2011)
8. • Speech

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   Graphene growth by CVD using liquid precursors

   Campos Delgado, Jessica[UCL] Botello Mendez, Andrés Rafael[UCL] Hackens, Benoît[UCL] Charlier, J.-C.[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) Lavoisier Discussions - Graphene on metals: CVD growth and exploitation — Abbaye-Ecole de Sorèze, France
9. • Speech

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   Ultra High strain hardening in nanocrystalline Pd thin films with nanotwins

   Pardoen, Thomas[UCL] Idrissi, Hosni WANGA MVEMBA, Binjie Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Schryvers, D. (2011) Plasticity'11 — Puerto Vallarta, Mexico
10. • Journal article

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    Experimental observations of surface roughness in uniaxially loaded strained Si microelectromechanical systems-based structures

    Escobedo-Cousin, Enrique Olsen, Sarah H. Pardoen, Thomas[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2011) Applied Physics Letters — Vol. 99, p. 241906 (2011)
11. • Journal article

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    Note: Fast and reliable fracture strain extraction technique applied to silicon at nanometer scale

    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Sodervall, Ulf Nilsson, Bengt Petersson, Goran Hagberg, Mats Raskin, Jean-Pierre[UCL] (2011) Review of Scientific Instruments — Vol. 82, p. 116106 (2011)
12. • Speech

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    Imperfection, rate and size dependent plastic localization in thin nanocrystalline metallic films

    Pardoen, Thomas[UCL] Coulombier, Michaël[UCL] Colla, Marie-Stéphane[UCL] Idrissi, Hosni Wang, Binjie Schrijvers, Dominique Raskin, Jean-Pierre[UCL] (2011) DYMAT, 20th Technical meeting: mechanical behaviour of nanomaterials, metallic glasses and architecturally designed materials — Maison de la chimie, Paris, France
13. • Journal article

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    On the MOSFET Threshold Voltage Extraction by Transconductance and Transconductance-to-Current Ratio Change Methods: Part I—Effect of Gate-Voltage-Dependent Mobility

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Arshad, M.K.M. Raskin, Jean-Pierre[UCL] Nazarov, A. Flandre, Denis[UCL] (2011) IEEE Transactions on Electron Devices — no. 99, p. 1-8 (14 octobre 2011)
14. • Speech

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    Deformation mechanisms in aluminium and aluminium-silicon freestanding thin films uncovered through on-chip testing

    Coulombier, Michaël[UCL] Ryelandt, Laurence[UCL] Idrissi, Hosni[UCL] Wang, Bingyu[UCL] Schrijvers, D.[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2011) European Congress on Advanced Materials and Processes – EuroMAT 2011 — Montpellier, France
15. • Speech

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    Experimental evidences of competing stress relaxation mechanisms in thin Al/Si and Pd films tested on chip

    Coulombier, Michaël[UCL] Guisbiers, Grégory[UCL] Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2011) MRS Fall meeting — Boston, USA
16. • Speech

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    A novel approach for active pressure sensors in thin film SOI technology

    Olbrechts, Benoit[UCL] Rue, Bertrand[UCL] Pardoen, Thomas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2011) International conference Eurosensors XXV — Athènes (Grèce)
17. • Journal article

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    The impact of etched trenches geometry and dielectric material on the electrical behaviour of SOI self-switching diodes

    Farhi, G. Morris, D. Charlebois, S.A. Raskin, Jean-Pierre[UCL] (2011) Nanotechnology — Vol. 22, no.43, p. 435203 (2011)
18. • Journal article

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    Mobility degradation and transistor asymmetry impact on field effect transistor access resistances extraction

    Tinoco, J.C. Martinez-Lopez, A.G. Raskin, Jean-Pierre[UCL] (2011) Solid-State Electronics — Vol. 56, no. 1, p. 214-218 (February 2011)
19. • Speech

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    Study of Twins in nanoscale Pd films with high strain hardening capacity

    Schryvers, D. Idrissi, H. Wang, Binjie Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2011) TMS Annual Meeting & Exhibition — San Diego, USA
20. • Speech

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    Fracture mechanics based analysis of the scratch resistance of thin Cr based coatings

    Favache, Audrey[UCL] Teillet, A. Poirier, C. Pardoen, Thomas[UCL] Jacques, Pascal[UCL] Carbonnelle, Pierre[UCL] Raskin, Jean-Pierre[UCL] Bailly, Christian[UCL] Nysten, Bernard[UCL] (2011) European Symposium on Friction, Wear and Wear Protection — Karlsruhe (Germany)
21. • Speech

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    Innovative Frequency Output Pressure Sensor with Single SOI NMOSFET Suspended Transducer

    Olbrechts, Benoit[UCL] Rue, Bertrand[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2011) IEEE International SOI Conference(SOI 2011) — Tempe (USA)
22. • Journal article

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    Erbium Silicide Growth in the Presence of Residual Oxygen

    Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Godey, Sylvie Dubois, Emmanuel Laszcz, Adam Ratajczak, Jacek Vlad, Alexandru[UCL] Dutu, Constantin Augustin[UCL] Raskin, Jean-Pierre[UCL] (2011) Journal of the Electrochemical Society — Vol. 158, no. 7, p. H715-H723 (11/05/2011)
23. • Speech

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    Approche du comportement tribologique de couches minces de chrome par la mécanique de la rupture

    Favache, Audrey[UCL] Teillet, A. Poirier, C. Carbonnelle, P. Raskin, Jean-Pierre[UCL] Jacques, Pascal[UCL] Nysten, Bernard[UCL] Bailly, Christian[UCL] Pardoen, Thomas[UCL] (2011) Journées internationales francophones de tribologie 2011 — Obernai (France)
24. • BookChapter

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    Specific features of MuGFETs behavior at high temperatures in a wide frequency range

    Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2011) CMOS Nanoelectronics: Innovative Devices, Architectures and Applications —
25. • Journal article

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    Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins

    Idrissi, Hosni Wang, Binjie Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Schryvers, Dominique Pardoen, Thomas[UCL] (2011) Advanced Materials — Vol. 23, no. 18, p. 2119-2122

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