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1. • Journal article

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   CMOS compatible anodic Al2O3 based sensors for bacteria detection

   Moreno-Hagelsieb, L. Nizet, Y. Tang, Xiaohui[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Francis, Laurent[UCL] (2009) Procedia Chemistry — Vol. 1, p. 1283-1286 (2009)
2. • Journal article

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   Experimental evidence of MOSFET high frequency noise reduction by channel engineering

   Emam, M. Sakalas, P. Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] Lim, T. Danneville, F. (2009) IEEE Transactions on Electron Devices — Vol. 56, no.7, p. 1516-1522 (2009)
3. • Journal article

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   Experimental Investigation of RF Noise Performance Improvement in Graded-Channel MOSFETs

   Emam, Mostafa[UCL] Sakalas, Paulius Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] Lim, Tho Chuan Danneville, Francois (2009) IEEE Transactions on Electron Devices — Vol. 56, no. 7, p. 1516-1522 (2009)
4. • Journal article

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   An electrical evaluation method for the silicidation of silicon nanowires

   Tang, Xiaohui[UCL] Flandre, Denis[UCL] Reckinger, Nicolas[UCL] Bayot, Vincent[UCL] Dubois, Emmanuel Yarekha, D. A. Larrieu, Guilhem Lecestre, A. Ratajczak, J. Breil, N. Passi, Vikram[UCL] Raskin, Jean-Pierre[UCL] (2009) Applied Physics Letters — Vol. 95, no. 2 (2009)
5. • Journal article

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   New On-Chip Nanomechanical Testing Laboratory - Applications to Aluminum and Polysilicon Thin Films

   Gravier, Sebastien Coulombier, Michaël[UCL] Safi, Asmahan André, Nicolas[UCL] Boe, Alexandre[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2009) IEEE Journal of Microelectromechanical Systems — Vol. 18, no. 3, p. 555-569 (2009)
6. • Journal article

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   Optimization of RF Performance of Metallic Source/Drain SOI MOSFETs Using Dopant Segregation at the Schottky Interface

   Valentin, Raphael Dubois, Emmanuel Larrieu, Guilhem Raskin, Jean-Pierre[UCL] Dambrine, Gilles Breil, Nicolas Danneville, Francois (2009) IEEE Electron Device Letters — Vol. 30, no. 11, p. 1197-1199 (2009)
7. • Journal article

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   Temperature Effect on Lorentz Based Magnetometer

   Sobieski, Stanislas[UCL] André, Nicolas[UCL] Raskin, Jean-Pierre[UCL] Francis, Laurent[UCL] (2009) Sensor Letters — Vol. 7, no. 3, p. 456-459 (2009)
8. • Speech

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   Impact of hydriding cycles on mechanical properties of palladium thin film

   Colla, Marie-Stéphane[UCL] Delmelle, Renaud[UCL] Boé, A. Coulombier, Michaël[UCL] Raskin, Jean-Pierre[UCL] Proost, Joris[UCL] Pardoen, Thomas[UCL] (2009) Innovations in Thin Film Processing and Characterization - ITFPC'09 — Nancy - France
9. • Speech

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   The impact of externally applied mechanical stress on analog and RF performances of SOI MOSFETs

   Emam, Mostafa[UCL] Houri, Samer[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2009) 8th Diagnostics & Yield Symposium — Warszaw, Poland
10. • Speech

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    SOI technology: an opportunity for RF designers?

    Raskin, Jean-Pierre[UCL] (2009) Fifth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’09 — Göteborg, Sweden
11. • Speech

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    Analog, RF and nonlinear behaviors of submicron graded channel partially depleted SOI MOSFETs

    Emam, Mostafa[UCL] Pavanello, M.A. Danneville, F. Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2009) 39th European Solid-State Device Research Conference. ESSDERC 2009 — Athens, Greece
12. • Speech

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    Substrate Effects in sub-32 nm ultra thin SOI MOSFETs with thin buried oxide

    Burignat, Stéphane[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Andrieu, F. Faynot, O. Raskin, Jean-Pierre[UCL] (2009) EUROSOI Conference 2009 — Göteborg (Sweden)
13. • Speech

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    Mechanical properties of anodic aluminum oxide for microelectromechanical system applications

    Moreno Hagelsieb, Luis[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2008) 15th Workshop on Dielectrics in Microelectronics (WoDiM 2008) — Bad Saarow (Germany)
14. • Speech

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    Wedge opening test for measuring the adhesion of thin films : applications and separation by multiscale modeling of the different energy contributions

    Strepenne, François[UCL] Poirier, C. Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2009) 12th International Congress on Fracture, ICF12 — Ottawa, Cananda
15. • Speech

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    Strain gradient plasticity based modeling of the necking in thin metallic films: influence of grain size and imperfections

    Brugger, Charles[UCL] Coulombier, Michaël[UCL] Boé, A. Raskin, Jean-Pierre[UCL] Massart, T.J. Pardoen, Thomas[UCL] (2009) Materials Science & Technology Conference & Exhibition 2009 — Pittsburgh, Pennsylvania, USA
16. • Speech

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    Metallic Source/Drain Architecture for Advanced MOS Technology: an overview of METAMOS results

    Dubois, Emmanuel Larrieu, Guilhem Breil, Nicolas Valentin, R. Danneville, F. Yarekha, D. Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Halimaoui, Aomar Rengel, R. Pascual, E. Pouydebasque, A. Wallart, X. Godey, S. Ratajczak, J. Laszcz, A. Katcki, J. Raskin, Jean-Pierre[UCL] Dambrine, Gilles Cros, A. Skotnicki, T. (2009) 8th Diagnostics & Yield Symposium — Warszaw (Poland)
17. • Speech

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    Silicon nanostructures for biosensors.

    Dutu, Constantin Augustin[UCL] Vlad, Alexandru[UCL] Raskin, Jean-Pierre[UCL] Melinte, Sorin[UCL] (2009) International Balkan Workshop on Applied Physics IBWAP2009 — Constanta (Romania)
18. • Journal article

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    Effect of geometrical nonlinearity on MEMS thermoelastic damping

    Mendez, C.[UCL] Paquay, S. Klapka, I. Raskin, Jean-Pierre[UCL] (2009) Nonlinear Analysis: Real World Applications — Vol. 10, no. 3, p. 1579-1588 (2009)
19. • Journal article

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    Internal stress relaxation based method for elastic stiffness characterization of very thin films

    Boe, Alexandre[UCL] Safi, A.[UCL] Coulombier, Michaël[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2009) Thin Solid Films — Vol. 518, no. 1, p. 260-264 (2009)
20. • Journal article

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    Schottky barrier lowering with the formation of crystalline Er silicide on n-Si upon thermal annealing

    Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Yarekha, Dmitri A. Dubois, Emmanuel Godey, Sylvie Wallart, Xavier Larrieu, Guilhem Laszcz, Adam Ratajczak, Jacek Jacques, Pascal[UCL] Raskin, Jean-Pierre[UCL] (2009) Applied Physics Letters — Vol. 94, no. 19 (2009)
21. • Journal article

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    MEMS-based microstructures for nanomechanical characterization of thin films

    Boe, Alexandre[UCL] Safi, A.[UCL] Coulombier, Michaël[UCL] Fabregue, D. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2009) Smart Materials and Structures — Vol. 18, no. 11 (2009)
22. • Journal article

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    A Simple Method for Measuring Si-Fin Sidewall Roughness by AFM

    Tang, Xiaohui[UCL] Bayot, Vincent[UCL] Reckinger, Nicolas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Dubois, Emmanuel Nysten, Bernard[UCL] (2009) IEEE Transactions on Nanotechnology — Vol. 8, no. 5, p. 611-616 (2009)
23. • Speech

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    Behaviour of CPW and TFMS lines versus high temperature for RF applications in sub-45 nm nodes

    Roda Neve, Cesar[UCL] Farcy, A. Gallitre, M. Blampey, B. Meuris, P. Arnaud, L. Raskin, Jean-Pierre[UCL] (2009) Eighteenth European Workshop on Materials for Advanced Metallization - MAM 2009 — Grenoble, France
24. • Speech

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    Size dependent ductility of thin metallic films using internal stress driven nanotesting structures

    Coulombier, Michaël[UCL] Boé, A. Ryelandt, Sophie[UCL] Brugger, Charles[UCL] Wang, B. Idrissi, H. SCHRIJVERS, D. Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2009) Innovations in Thin Film Processing and Characterization - ITFPC'09 — Nancy - France
25. • Speech

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    Strain gradient plasticity based modeling of the ductility of thin freestanding metallic films (oral pres. By C. Brugger)

    Brugger, Charles[UCL] Coulombier, Michaël[UCL] Boé, A. Raskin, Jean-Pierre[UCL] Massart, T.J. Pardoen, Thomas[UCL] (2009) IICSMA 15 - 15th International Conference on the Strength of Materials — Dresden

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