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Displaying 16 results.
    • Journal article
    Ultra-low Power High Temperature and Radiation Hard Complementary Metal-Oxide-Semiconductor (CMOS) Silicon-on-Insulator (SOI) Voltage Reference
    Boufouss, El Hafed[UCL] Francis, Laurent[UCL] Kilchytska, Valeriya[UCL] Gérard, Pierre[UCL] Simon, Pascal[UCL] Flandre, Denis[UCL] (2013) Sensors — Vol. 13, no. 12, p. 17265-17280 (13/12/2013)
    • Speech
    High Temperature and Radiation Hard CMOS SOI Sub-threshold Voltage Reference
    Boufouss, El Hafed[UCL] Gérard, Pierre[UCL] Simon, Pascal[UCL] Francis, Laurent[UCL] Flandre, Denis[UCL] (2013) IEEE S3S Conference — Monterey, CA (USA)
    • Speech
    Optimization of Spiral Inductors on High-resistivity SOI Substrates for Low-power LC-VCO Design
    Delatte, Pierre[UCL] Simon, Pascal[UCL] Demeûs, Laurent[UCL] Flandre, Denis[UCL] (2005) First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2005) — Granada, Spain
    • Speech
    A low-power 5 GHz CMOS LC-VCO optimized for high-resistivity SOI substrates
    Delatte, Pierre[UCL] Picun, Gonzalo Demeus, Laurent Simon, Pascal[UCL] Flandre, Denis[UCL] (2005) 31st European Solid-State Circuits Conference — Grenoble, France
    • Speech
    Deep-submicron DC to RF SOI MOSFET characterization and modelling
    Iniguez, Benjamin Demeûs, Laurent[UCL] Nève, Amaury[UCL] Flandre, Denis[UCL] D'Hayer, S.[UCL] Simon, Pascal[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raynaud, C.[UCL] (1999) 1999 International Semiconductor device research Symposium — Charlottesville (USA)
    • Speech
    Leakage components in fully-depleted SOI CMOS technology: implications on IDDQ testing
    Iniguez, B. Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Flandre, Denis[UCL] Segura, J. (2001) 2001 IEEE International Workshop on Defect Based Testing (DBT 2001) — Marina del Rey, Los Angeles (USA)
    • Speech
    Analysis and future trends of Iddq testing for silicon on insulator CMOS ICs
    Iniguez, Benjamin[UCL] Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Flandre, Denis[UCL] Segura, J.[UCL] (2001) 2001 IEEE International Workshop on Current and Defect Based Testing (DBI'2001) — Los Angeles (USA)
    • Speech
    Revised Split C-V Technique for Mobility Investigation in Advanced Devices
    Kilchytska, Valeriya[UCL] Lederer, Dimitri[UCL] Simon, Pascal[UCL] Collaert, N. Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2005) 2005 IEEE International SOI Conference — Hawaii (USA)
    • Speech
    Testing SOI CMOS IC's with Parametric Testing Methods: a Fundamental Analysis
    Iniguez, Benjamin Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Flandre, Denis[UCL] Segura, Jaume (2001) XVI Conference on Design of Circuits and Integrated Systems (DCIS 2001) — Porto (Portugal)
    • Speech
    SOI CMOS for Low-Voltage, Low-Power Microwave Applications
    Raskin, Jean-Pierre[UCL] Vanhoenacker-Janvier, Danielle[UCL] Dehan, M.[UCL] Goffioul, Pauline[UCL] Simon, Pascal[UCL] Iniguez, Benjamin[UCL] Renaux, Christian[UCL] Flandre, Denis[UCL] (2000) EUROSOI 2000 Meeting on Silicon-on-Insulator Devices — Granada (Espagne)
    • Speech
    Fully depleted SOI CMOS technology for heterogeneous micropower, high-temperature or RF microsystems
    Flandre, Denis[UCL] Adriaensen, Stéphane[UCL] Akheyar, A. Crahay, André[UCL] Demeus, L. Delatte, Pierre[UCL] Dessard, V. Iniguez, B.[UCL] Neve, A.[UCL] Katschmarskyj, Bohdan[UCL] Loumaye, Pierre[UCL] Laconte, J.[UCL] Martinez, I[UCL] Picun, G.[UCL] Rauly, E.[UCL] Renaux, Christian[UCL] Spote, David[UCL] Zitout, Miloud[UCL] Dehan, Morin[UCL] Parvais, Bertrand[UCL] Simon, Pascal[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2001) European Meeting on Silicon-on-Insulator Devices (EUROSOI-2000) — Granada (Spain)
    • Journal article
    Deep-submicrometer DC-to-RF SOI MOSFET macro-model
    Iniguez, Benjamin[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Demeus, Laurent[UCL] Neve, Amaury[UCL] Vanhoenacker-Janvier, Danielle[UCL] Simon, Pascal[UCL] Goffioul, M.[UCL] (2001) IEEE Transactions on Electron Devices — Vol. 48, no. 9, p. 1981-1988 (2001)
    • Journal article
    A review of leakage current in SOI CMOS ICs: impact on parametric testing techniques
    Iniguez, Benjamin Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Segura, Jaume (2003) Solid-State Electronics — Vol. 47, no. 11, p. 1959-1967 (2003)
    • Speech
    A new fully-depleted SOI MOSFET macro-model valid from DC to RF
    Iniguez, Benjamin[UCL] Raskin, Jean-Pierre[UCL] Demeûs, Laurent[UCL] Nève de Mévergnies, Amaury[UCL] Goffioul, Michael[UCL] Simon, Pascal[UCL] Vanhoenacker-Janvier, Danielle[UCL] Flandre, Denis[UCL] (2001) Tenth International Symposium on Silicon-on-Insulator Technology and Devices — Washington, DC (USA)
    • Speech
    Revised split C-V technique for mobility investigation in advanced devices
    Kilchytska, Valeriya[UCL] Lederer, Dimitri[UCL] Simon, Pascal[UCL] Collaert, Nadine[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2005) 2005 IEEE International SOI Conference — Honolulu, HI, USA
    • Speech
    Small- and Large-Signal RF Characterization of Fully-Depleted Accumulation-mode Varactors for Low-Voltage LC-VCO SOI Design
    Parvais, Bertrand[UCL] Delatte, Pierre[UCL] Matsuhashi, H. Ichikawa, F. Simon, Pascal[UCL] Schreurs, Dominique[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2004) 2004 IEEE International SOI Conference — Charleston (USA)