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Displaying 2 results.
    • Journal article
    Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams
    Mouhib, T. Poleunis, Claude[UCL] Wehbe, N.[FUNDP] Michels, J. J. Galagan, Y. Houssiau, L.[FUNDP] Bertrand, Patrick[UCL] Delcorte, Arnaud[UCL] (2013) The Analyst — Vol. 138, no.22, p. 6801-6810 (2013)
    • Journal article
    TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn
    Wehbe, N.[FUNDP] Tabarrant, T.[FUNDP] Brison, J.[FUNDP] Mouhib, Taoufiq[UCL] Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Moellers, R. Niehuis, E. Houssiau, L.[UCL] (2013) Surface and Interface Analysis — Vol. 45, no. 1, p. 178-180 (2013)