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    • Journal article
    Sputtering kilodalton fragments from polymers
    Delcorte, Arnaud[UCL] Arezki, Bahia[UCL] Bertrand, Patrick[UCL] Garrison, BJ (2002) Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms — Vol. 193, no. 1-4, p. 768-774 (2002)
    • Speech
    Invited talk : Molecular dynamics for surface mass spectrometry
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Garrison, B.J. (2003) International workshop on reactive classical potentials versus hybrid methods: toward chemical complexity, at the European Centre for Atomic and Molecular Computations (CECAM) — Lyon (France)
    • Journal article
    An Iss Study of Thin Metallic Layers Evaporated On Gold Substrate - Experimentation Versus Simulation
    Beuken, Jean-Michel[UCL] Bertrand, Patrick[UCL] (1992) Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms — Vol. 67, no. 1-4, p. 340-344 (1992)
    • Journal article
    2 keV He and Ne Ion-scattering On a Cu(110) Surface - Experiment Vs Simulation
    Houssiau, L. Bertrand, Patrick[UCL] (1994) Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms — Vol. 90, no. 1-4, p. 247-251 (2004)
    • Speech
    Study of non-functional silane coatings by means of complementary surface analysis methods (poster)
    Franquet, A. Terryn, H. Vereecken, Jean Bertrand, Patrick[UCL] Delcorte, Arnaud[UCL] (1999) 8th European Conference on Applications of Surface and Interface Analysis, ECASIA=99 — Sevilla, Spain
    • Journal article
    Evidence of simple intramolecular rearrangement at polymer end groups in secondary ion mass spectrometry.
    Vanden Eynde, Xavier[UCL] Oike Hamada Tezuka Bertrand, Patrick[UCL] (1999) Rapid communications in mass spectrometry : RCM — Vol. 13, no. 19, p. 1917-1923 (1999)
    • Journal article
    Etude "in situ" de la formation de l'interface métal-polymère par spectrométries ioniques ISS et SIMS statique
    Bertrand, Patrick[UCL] Travaly, Youssef[UCL] De Puydt, Yves[UCL] (1993) Le Vide, les couches minces — Vol. 268, no. suppl , p. 87-89 (1993)
    • BookChapter
    Study of sizing extraction and ammonia plasma treatment of carbon fibers by combined Time-of-Flight Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy
    Wiertz, Véronique[UCL] Weng, Lu-Tao[UCL] Bertrand, Patrick[UCL] (1996) Carbon and carbonaceous composite materials, structure-property relationships — [ISBN : 981-02-2801-5]
    • Journal article
    [Study In-situ of Metal-polymer Interface Formation Using Iss and Static Sims Ionic Spectrometry]
    Bertrand, Patrick[UCL] Travaly, Y. Depuydt, Y. (1993) Le Vide: Science, Technique et Applications — no. 268, p. 87-89 (1993)
    • Journal article
    Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition.
    Delcorte, Arnaud[UCL] Médard, N Bertrand, Patrick[UCL] (2002) Analytical Chemistry — Vol. 74, no. 19, p. 4955-4968 (2002)
    • Journal article
    A high-resolution energy analyser for surface studies by ion scattering spectrometry (ISSS)
    Bertrand, Patrick[UCL] Delannay, Francis[UCL] Streydio, Jean-Marie[UCL] (1977) Journal of Physics E: Scientific Instruments — Vol. 10, no. 4, p. 403-407 (1977)
    • Speech
    Invited talk : How do large organic molecules sputter? Insights from ToF-SIMS and Molecular Dynamics simulations
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Vickerman, J.C. Garrison, B.J. (1999) 12th International Conference on Secondary Ion Mass Spectrometry — Brussels (Belgium)
    • BookChapter
    Annealing behaviour of Cu metallized PET : influence of the environment
    Gollier, Paul-André[UCL] Bertrand, Patrick[UCL] (1996) ICPSI - 2, Polymer-Solid Interfaces : From Model to Real Systems —
    • Contribution à ouvrage collectif (Book Chapter)
    Ion beam patterned polymer surfaces for selective polyelectrolyte multilayer build-up
    Delcorte, Arnaud[UCL] Bertrand, Patrick[UCL] Wischerhoff, Erik[UCL] Laschewsky, André[UCL] (2000) Secondary Ion Mass Spectrometry, SIMS XII — [ISBN : 0-444-50323-4]
    • Journal article
    Surface characterization of organic materials by ToF-SIMS: How to improve the sensitivity
    Bertrand, Patrick[UCL] Delcorte, Arnaud[UCL] (2006) American Chemical Society. Abstracts of Papers (at the National Meeting) — Vol. 231 (2006)

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