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Displaying 11 results.
    • Speech
    3D simulation and measurement of very narrow AM and IM triple-gate MOSFETs
    Yan, Ran Afzalian, Aryan[UCL] Lee, Chi-Woo Dehdashti Akhavan, Nima Xiong, Weize Colinge, Jean-Pierre (2008) 2008 China-Ireland International Conference on Information and Communication Technologies (CIICT 2008) — Beijing (China)
    • Journal article
    Drain breakdown Voltage in MuGFETs: Influence of Physical Parameters
    Lee, Chi-Woo Afzalian, Aryan[UCL] Yan, Ran Dehdasti Akhavan, Nima Xiong, Weize Colinge, Jean-Pierre (2008) IEEE Transactions on Electron Devices — Vol. 55, no.12, p. 3503-3506 (November 2008)