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Displaying 18 results.
    • Speech
    Leakage components in fully-depleted SOI CMOS technology: implications on IDDQ testing
    Iniguez, B. Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Flandre, Denis[UCL] Segura, J. (2001) 2001 IEEE International Workshop on Defect Based Testing (DBT 2001) — Marina del Rey, Los Angeles (USA)
    • Speech
    Photo-induced switching of microwave and millimeter-wave signals on coplanar waveguides
    Koers, G. Poesen, G. Simon, Pascal[UCL] Raskin, Jean-Pierre[UCL] Stiens, J. Huynen, Isabelle[UCL] Vounckx, R. (2002) Seventh Annual Symposium of the IEEE/LEOS Benelux chapter — Amsterdam, Netherlands
    • Speech
    Modeling photo-induced plasmas in planar transmission lines for switching millimeter-wave signals
    Poesen, G. Koers, G. Simon, Pascal[UCL] Raskin, Jean-Pierre[UCL] Huynen, Isabelle[UCL] Stiens, J. Vounckx, R. (2003) IEEE International Topical Meeting on Microwave Photonics - MWP 2003 — Budapest, Hungary
    • Journal article
    Behavior of a traveling-wave amplifier versus temperature in SOI technology
    Si Moussa, Mehdi[UCL] Pavageau, Christophe Simon, Pascal[UCL] Danneville, François Russat, Jean Fel, Nicolas Raskin, Jean-Pierre[UCL] Vanhoenacker-Janvier, Danielle[UCL] (2006) IEEE Transactions on Microwave Theory and Techniques — Vol. 54, no. 6, p. 2675-2683 (June 2006)
    • Speech
    Analysis and future trends of Iddq testing for silicon on insulator CMOS ICs
    Iniguez, Benjamin[UCL] Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Flandre, Denis[UCL] Segura, J.[UCL] (2001) 2001 IEEE International Workshop on Current and Defect Based Testing (DBI'2001) — Los Angeles (USA)
    • Speech
    Testing SOI CMOS IC's with Parametric Testing Methods: a Fundamental Analysis
    Iniguez, Benjamin Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Flandre, Denis[UCL] Segura, Jaume (2001) XVI Conference on Design of Circuits and Integrated Systems (DCIS 2001) — Porto (Portugal)
    • Speech
    SOI CMOS for Low-Voltage, Low-Power Microwave Applications
    Raskin, Jean-Pierre[UCL] Vanhoenacker-Janvier, Danielle[UCL] Dehan, M.[UCL] Goffioul, Pauline[UCL] Simon, Pascal[UCL] Iniguez, Benjamin[UCL] Renaux, Christian[UCL] Flandre, Denis[UCL] (2000) EUROSOI 2000 Meeting on Silicon-on-Insulator Devices — Granada (Espagne)
    • Journal article
    Deep-submicrometer DC-to-RF SOI MOSFET macro-model
    Iniguez, Benjamin[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Demeus, Laurent[UCL] Neve, Amaury[UCL] Vanhoenacker-Janvier, Danielle[UCL] Simon, Pascal[UCL] Goffioul, M.[UCL] (2001) IEEE Transactions on Electron Devices — Vol. 48, no. 9, p. 1981-1988 (2001)
    • Journal article
    A review of leakage current in SOI CMOS ICs: impact on parametric testing techniques
    Iniguez, Benjamin Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Segura, Jaume (2003) Solid-State Electronics — Vol. 47, no. 11, p. 1959-1967 (2003)
    • Speech
    A new fully-depleted SOI MOSFET macro-model valid from DC to RF
    Iniguez, Benjamin[UCL] Raskin, Jean-Pierre[UCL] Demeûs, Laurent[UCL] Nève de Mévergnies, Amaury[UCL] Goffioul, Michael[UCL] Simon, Pascal[UCL] Vanhoenacker-Janvier, Danielle[UCL] Flandre, Denis[UCL] (2001) Tenth International Symposium on Silicon-on-Insulator Technology and Devices — Washington, DC (USA)