Accès à distance ? S'identifier sur le proxy UCLouvain
Displaying 1 - 25 of 1139 results.
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(2019) 63ièmes journées du GUMP (Groupe des Utilisateurs de Microscopie électronique Philips-FEI) — CSNSM/JANNuS-Orsay, Orsay (France) -
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(2020) 17th European Mechanics of Materials Conference (EMMC17) — Madrid (Spain) -
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(2020) Plasticité 2020 — Toulouse (France) -
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(2015) 9th European Solid Mechanics Conference – ESMC’15 — Madrid (Spain) -
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(2020) Aussois 2020 - Contraintes résiduelles: de nouveaux outils pour de nouveaux défis — Aussois, France -
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(2020) 2020 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) — Los Angeles, CA, USA -
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(2019) The 2nd European Conference on Service-Learning in Higher Education - ECSL 2019 — Antwerpen (Belgium) -
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(2017) Sustainable energy for Africa — Palace of the Academies, Brussels (Belgium) -
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(2020) 2020 IEEE International Electron Devices Meeting (IEDM) — San Francisco, CA, USA -
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(1998) IEEE Transactions on Electron Devices — Vol. 45, no.5, p. 1017-1025 (1998) -
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(2020) Proceedings — Vol. 60, no. 1, p. 61 (2020) -
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(2005) Electrochemical and Solid-State Letters — Vol. 8, no. 10, p. G268-G270 (2005) -
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(2007) IEEE ELECTRON DEVICE LETTERS — Vol. 28, no. 5, p. 419-421 (May 2007) -
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(2023) 2023 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP) — Valetta, Malta -
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(2022) The 242nd ElectroChemical Society Meeting – ECS 2022 — Atlanta, GA, USA -
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(2023) 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS) — Edinburgh, UK -
- Journal article
(2023) IEEE Transactions on Electron Devices — , p. 1-6 (2023) -
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(2023) Solid-State Electronics — Vol. 207, p. 108706 (2023) -
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(2022) Euro-Mediterranean Conference on Materials, Devices and Systems - EMCM-DS 2022 — Fez, Morocco -
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(2022) ECI Nanomechanical Testing in Materials Research and Development VIII — Split, Croatia -
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(2023) Measurement Science and Technology — Vol. 34, no.12, p. 125027 (2023) -
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(2022) The Nuclear Materials Conference – NuMat 2022 — Ghent, Belgium -
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(2023) Journal of Materials Science: Materials in Electronics — Vol. 34, p. 373 (2023) -
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(2022) IEEE Journal of the Electron Devices Society — Vol. 10, no.1, p. 620-626 (2022)