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1. • Speech

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   CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities

   Yadav, S. Cardinael, Pieter[UCL] Zhao, M. Peralagu, U. Alian, A. Khaled, A. Makovejev, S. Ekoga, E. Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] Parvais, B. Collaert, N. (2021) International Conference on IC Design and Technology 2021 — Dresden, Germany
2. • Speech

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   Impact of III-N buffer layers on RF losses and harmonic distortion of GaN-on-Si Substrates

   Cardinael, Pieter[UCL] Yadav, S. Zhao, M. Rack, Martin[UCL] Lederer, Dimitri[UCL] Collaert, N. Parvais, B. Raskin, Jean-Pierre[UCL] (2021) European Solid-State Device Research Conference (ESSDERC 2021) — Grenoble, France
3. • Speech

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   FD-SOI mm-Wave Differential Single-Pole Switches with Ultra-High Isolation

   Rack, Martin[UCL] Nyssens, Lucas[UCL] Wane, Sidina Bajon, Damienne Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) — Hsinchu, Taiwan
4. • Journal article

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   Frequency Variation of the Small-Signal Output Conductance of Decananometer MOSFETs Due to Substrate Crosstalk

   Kilchytska, Valeriya[UCL] Pailloncy, Guillaume[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] Collaert, N. Jurczak, M. Flandre, Denis[UCL] (2007) IEEE ELECTRON DEVICE LETTERS — Vol. 28, no. 5, p. 419-421 (May 2007)
5. • Speech

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   Substrate effects in GaN-on-Si HEMT technology for RF FEM applications

   Yadav, S. Cardinael, Pieter[UCL] Zhao, M. Vondkar, K. Peralagu, U. Alian, A. Rodriguez, R. Khaled, A. Makovejev, S. Ekoga, E. Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] Parvais, B. Collaert, N. (2022) The 242nd ElectroChemical Society Meeting – ECS 2022 — Atlanta, GA, USA
6. • Speech

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   Substrate noise mitigation using high resistivity base silicon wafer for a 14 GHz VCO on 28 nm FD-SOI

   Bendou, Youssef[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] cathelin, Andreia Raskin, Jean-Pierre[UCL] (2023) 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS) — Edinburgh, UK
7. • Journal article

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   Impact of High Temperature Up to 175 ∘ C on the DC and RF Performances of 22-nm FD-SOI MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Vanbrabant, Martin[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Transactions on Electron Devices — , p. 1-6 (2023)
8. • Journal article

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   Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 207, p. 108706 (2023)
9. • Speech

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   High-Resistivity substrates with PN interface passivation in 22 nm FD-SOI

   Rack, Martin[UCL] Nyssens, Lucas[UCL] Nabet, Massinissa[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2022) The 2022 International Symposium on VLSI Technology Systems and Applications (VLSI-TSA) — Hsincu, Taiwan
10. • Speech

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    Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI

    Rack, Martin[UCL] Nyssens, Lucas[UCL] Courte, Quentin[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2021) ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference — Grenoble, France
11. • Speech

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    Impact of substrate resistivity on spiral inductors at mm-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Schwan, C. Zhao, Z. Lehmann, S. Hermann, T. Allibert, F. Aulnette, C. Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
12. • Speech

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    22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C

    Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) 2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) — Las Vegas, NV, USA
13. • Journal article

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    Time Dependence of RF Losses in GaN-on-Si Substrates

    Cardinael, Pieter[UCL] Yadav, Sachin Zhao, Ming Rack, Martin[UCL] Lederer, Dimitri[UCL] Collaert, Nadine Parvais, Bertrand Raskin, Jean-Pierre[UCL] (2022) IEEE Microwave and Wireless Components Letters — Vol. 32, no.6, p. 688-691 (2022)
14. • Speech

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    Field-Effect Passivation of Lossy Interfaces in High-Resistivity RF Silicon Substrates

    Rack, Martin[UCL] Nyssens, Lucas[UCL] Nabet, Massinissa[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) — Caen, France
15. • Journal article

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    High-resistivity with PN interface passivation in 22 nm FD-SOI technology for low-loss passives at RF and millimeter-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Schwan, C. Zhao, Z. Lhemann, S. Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 205 (2023)
16. • Speech

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    PN Junctions Interface Passivation in 22 nm FD- SOI for Low-Loss Passives

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Schwan, C. Zhao, Z. Lehmann, S. Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] (2022) 24th International Microwave and Radar Conference (MIKON) — Gdansk, Poland
17. • Journal article

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    Impact of substrate resistivity on spiral inductors at mm-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Schwan, Christophe Zhao, Zhixing Lehmann, Steffen Hermann, Tom Allibert, Frederic Aulnette, Cécile Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2022) Solid-State Electronics — Vol. 194 (2022)
18. • Speech

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    Effect of probe coupling on MOSFET series resistance extraction up to 110 GHz

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2022) 2022 IEEE Latin America Electron Devices Conference (LAEDC) — Puebla, Mexico
19. • Speech

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    A DC-120 GHz SPDT Switch Based on 22 nm FD-SOI SLVT NFETs with Substrate Isolation Rings Towards Increased Shunt Impedance

    Rack, Martin[UCL] Nyssens, Lucas[UCL] Courte, Quentin[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2022) 2022 IEEE RFIC Symposium — Denver, Colorado, USA
20. • Speech

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    28 GHz Down-Conversion Mixer with RF Back-Gate Excitation Topology in 22-nm FD-SOI

    Nabet, Massinissa[UCL] Rack, Martin[UCL] Nyssens, Lucas[UCL] Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] (2022) 17th European Microwave Integrated Circuits Conference — Milan, Italy
21. • Speech

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    Energy-Efficient RF-Optics Multi-Beam Systems Using Correlation Technologies: Toward Hybrid GaN-FDSOI Front-End-Modules

    Wane, S. Ferrero, F. Sombrin, J. Tombakdjian, L. Bajon, D. Ratajczak, P. Molina, F. Rack, Martin[UCL] Nyssens, Lucas[UCL] Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] Craeye, Christophe[UCL] (2022) 2022 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems — Texas, USA
22. • Speech

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    A 2.5-2.6 dB Noise Figure LNA for 39 GHz band in 22 nm FD-SOI with Back-Gate Bias Tunability

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Wane, S. Schwan, C. Lehmann, S. Zhao, Z. Lucci, L. Lugo-Alvarez, J. Gaillard, F. Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] (2022) 17th European Microwave Integrated Circuits Conference — Milan, Italy
23. • Speech

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    Spintronics Technology Solutions for Interferometric Thermal-Electromagnetic Sensing

    Wane, S. Tran, Q. H. Dinh, T. V. Eddine, J. A. Duffourg, F. Ndagijimana, F. Bajon, D. Terki, F. Rioult, J. Darroman, J.-L. Bonnaire, L. Montfort, O. Huard, V. Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] Bousseksou, A. (2022) 2022 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems — Texas, USA
24. • Journal article

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    Probe-Dependent Residual Error Analysis for Accurate On-Wafer MOSFET Measurements up to 110 GHz

    L. Nyssens Ma, Shiqi[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Journal of the Electron Devices Society — Vol. 11, no.11, p. 650 - 657 (2023)
25. • BookChapter

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    Impact of a High-resistivity Substrate on RF and mm-wave Performance of 22 nm FD-SOI Devices and Circuits

    Rack, Martin;[UCL] Nyssens, Lucas;[UCL] Nabet, Massinissa[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Technologies Enabling Future Mobile Connectivity & Sensing — [ISBN : 9781032633039]

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