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1. • Journal article

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   Frequency Variation of the Small-Signal Output Conductance of Decananometer MOSFETs Due to Substrate Crosstalk

   Kilchytska, Valeriya[UCL] Pailloncy, Guillaume[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] Collaert, N. Jurczak, M. Flandre, Denis[UCL] (2007) IEEE ELECTRON DEVICE LETTERS — Vol. 28, no. 5, p. 419-421 (May 2007)
2. • Journal article

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   Impact of High Temperature Up to 175 ∘ C on the DC and RF Performances of 22-nm FD-SOI MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Vanbrabant, Martin[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Transactions on Electron Devices — , p. 1-6 (2023)
3. • Journal article

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   Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 207, p. 108706 (2023)
4. • Speech

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   Experimental study of thermal coupling effects in FD-SOI MOSFET

   Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
5. • Speech

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   Effect of Heat Sink in Back-End of Line on Self-Heating in 22 nm FDSOI MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2020) 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) — Caen, France
6. • Speech

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   22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) 2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) — Las Vegas, NV, USA
7. • Journal article

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   Back-Gate Lumped Resistance Effect on AC Characteristics of FD-SOI MOSFET

   Vanbrabant, Martin[UCL] Nyssens, Lucas[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) IEEE Microwave and Wireless Components Letters — Vol. 32, no.6, p. 704-707 (2022)
8. • Speech

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   Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks

   Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) The 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon - EuroSOI-ULIS'2022 — Udine, Italy
9. • Speech

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   Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI

   Nyssens, Lucas[UCL] Rack, Martin[UCL] Halder, Arka[UCL] Vanbrabant, Martin[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) — Hsinchu, Taiwan
10. • Journal article

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    Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Bin, Wang Faniel, Sébastien[UCL] Zeng, Yun Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Microelectronic Engineering — Vol. 254, no.111708, p. 7 (2022)
11. • Journal article

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    Experimental study of thermal coupling effects in FD-SOI MOSFET

    Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2022) Solid-State Electronics — Vol. 194, no.108362, p. 4 (2022)
12. • Journal article

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    Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications

    Kilchytska, Valeriya[UCL] Makovejev, Sergej Esfeh, Babak Kazemi Nyssens, Lucas[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) I E E E Journal of the Electron Devices Society — Vol. 9, p. 500-510 (2021)
13. • Speech

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    Determination of Carrier Lifetime in Silicon Using an Ultra-thin Al2O3/SiO2 Dielectric Stack

    Yan, Yiyi[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Faniel, Sébastien[UCL] Tang, Xiaohui[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 IEEE Latin America Electron Devices Conference (LAEDC) — Virtual conference
14. • Journal article

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    Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2022) Solid-State Electronics — Vol. 194, p. 4 (2022)
15. • Journal article

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    Improved Split CV Mobility Extraction in 28 nm Fully Depleted Silicon on Insulator Transistors

    Morelle, Alban Vandermolen, Eric Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) IEEE Electron Device Letters — Vol. 42, no.5, p. 661-664 (2021)
16. • Journal article

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    On the Separate Extraction of Self-Heating and Substrate Effects in FD-SOI MOSFET

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2021) IEEE Electron Device Letters — Vol. 42, no.5, p. 665-668 (2021)
17. • Journal article

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    Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid State Electronics — Vol. 207, no.207 (2023)
18. • Speech

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    Hexagonal Boron Nitride Memristor based on a nanogap self-formed by silicidation

    Yan, Yiyi[UCL] Reckinger, Nicolas Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Tang, Xiaohui[UCL] Malik, Mohammad Wasil[UCL] Hackens, Benoît[UCL] Raskin, Jean-Pierre[UCL] (2022) Mini Colloquia (MQ) on "Memristive Devices", The 6th Symposium on Schottky Barrier MOS Devices (SSBMOS) — Giessen, Germany
19. • Speech

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    Back-gate lumped resistance effect on AC characteristics of FD-SOI MOSFET

    Vanbrabant, Martin[UCL] Nyssens, Lucas[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) International Microwave Symposium - IMS 2022 — Denver, Colorado, USA
20. • Speech

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    Advanced MOSFETs Electrical Characterization for Further Analog and RF applications

    Kilchytska, Valeriya[UCL] Makovejev, Sergei[UCL] Esfeh, Babak Kazemi[UCL] Nyssens, Lucas[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) SBMicro — virtual conference
21. • Speech

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    28 FDSOI RF Figures of Merit down to 4.2 K

    Nyssens, Lucas[UCL] Halder, Arka[UCL] Planes, N. Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2019) IEEE S3S Conference — San Jose (USA)
22. • Journal article

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    Impact of thermal coupling effects on the digital and analog figures of merit of UTBB SOI MOSFET pairs

    Vanbrabant, Martin[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] (2023) Solid - State Circuits — Vol. 2023, p. 108623 (2023)
23. • Journal article

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    A Physical Model of Contact Resistance in Ti-Contacted Graphene-Based Field Effect Transistors

    Wang, Bin Malik, Mohammad Wasil[UCL] Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Zeng, Yun Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2021) IEEE Transactions on Electron Devices — Vol. 68, no.2, p. 892-898 (2021)
24. • Journal article

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    Experimental study of transconductance and mobility behaviors in ultrathin SOI MOSFETs with standard and thin buried oxides

    Rudenko, T. Kilchytska, Valeriya[UCL] Burignat, S. Raskin, Jean-Pierre[UCL] Andrieu, F. Faynot, O. Le Tiec, Y. Landry, K. Nazarov, A. Lysenko, V. S. Flandre, Denis[UCL] (2010) Solid-State Electronics — Vol. 54, p. 164-170 (2010)
25. • Journal article

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    Self-Heating in FDSOI UTBB MOSFETs at Cryogenic Temperatures and Its Effect on Analog Figures of Merit

    Nyssens, Lucas[UCL] Halder, Arka[UCL] Esfeh, Babak Kazemi[UCL] Planes, Nicolas Haond, Michel Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2020) I E E E Journal of the Electron Devices Society — Vol. 8, p. 789-796 (2020)

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