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Displaying 11 results.
    • Speech
    Effect of Heat Sink in Back-End of Line on Self-Heating in 22 nm FDSOI MOSFETs
    Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2020) 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) — Caen, France
    • Speech
    22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C
    Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) 2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) — Las Vegas, NV, USA
    • Speech
    Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI
    Nyssens, Lucas[UCL] Rack, Martin[UCL] Halder, Arka[UCL] Vanbrabant, Martin[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) — Hsinchu, Taiwan
    • Speech
    Back-gate lumped resistance effect on AC characteristics of FD-SOI MOSFET
    Vanbrabant, Martin[UCL] Nyssens, Lucas[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2022) International Microwave Symposium - IMS 2022 — Denver, Colorado, USA
    • Speech
    Advanced MOSFETs Electrical Characterization for Further Analog and RF applications
    Kilchytska, Valeriya[UCL] Makovejev, Sergei[UCL] Esfeh, Babak Kazemi[UCL] Nyssens, Lucas[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2021) SBMicro — virtual conference
    • Speech
    28 FDSOI RF Figures of Merit down to 4.2 K
    Nyssens, Lucas[UCL] Halder, Arka[UCL] Planes, N. Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2019) IEEE S3S Conference — San Jose (USA)
    • Speech
    Electrical characterization of advanced MOSFETs towards analog and RF applications
    Kilchytska, Valeriya[UCL] Makovejev, Sergej Kazemi Esfeh , Babak[UCL] Nyssens, Lucas[UCL] Halder, Arka[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2020) 2020 IEEE Latin America Electron Devices Conference (LAEDC) — San José (Costa Rica)
    • Speech
    Effect of heat sink Back-End of Line on self-heating in 22 nm FD SOI MOSFETs
    Halder, Arka[UCL] Nyssens, Lucas[UCL] Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2020) Sixth Joint International EUROSOI-ULIS — Caen (France)
    • Speech
    Assessment of RF compact modelling of FD SOI transistors
    Vanbrabant, Martin[UCL] Nyssens, Lucas[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2021) 2021 IEEE Latin America Electron Devices Conference (LAEDC) — Mexico, Mexico
    • Speech
    Self-Heating in 28 FDSOI UTBB MOSFETs at Cryogenic Temperatures
    Nyssens, Lucas[UCL] Halder, Arka[UCL] Kazemi Esfeh, Babak[UCL] Planes, Nicolas Haond, Michel Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Kilchytska, Valeriya[UCL] (2019) 49th European Solid-State Device Research Conference (ESSDERC 2019) — Cracow (Poland)
    • Speech
    Figures of merit of nanoscale transistors at cryogenic temperature: 28nm UTBB FD SOI nMOSFET case study
    Flandre, Denis[UCL] Kazemi Esfeh, Babak[UCL] Nyssens, Lucas[UCL] Halder, Arka[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2019) 3rd Symposium on Schottky barrier MOS devices — Gif-sur Yvette (France)