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1. • Speech

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   High Resistivity Trap-Rich Substrate for RF MEMS Switches

   Nabet, Massinissa[UCL] Rack, Martin[UCL] Huet, Benjamin[UCL] Tuyaerts, Romain[UCL] Scheen, Gilles[UCL] Raskin, Jean-Pierre[UCL] (2023) 2023 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP) — Valetta, Malta
2. • Speech

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   Substrate noise mitigation using high resistivity base silicon wafer for a 14 GHz VCO on 28 nm FD-SOI

   Bendou, Youssef[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] cathelin, Andreia Raskin, Jean-Pierre[UCL] (2023) 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS) — Edinburgh, UK
3. • Journal article

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   Impact of High Temperature Up to 175 ∘ C on the DC and RF Performances of 22-nm FD-SOI MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Vanbrabant, Martin[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Transactions on Electron Devices — , p. 1-6 (2023)
4. • Journal article

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   Comparison of Heat Sinks in Back-End of Line to reduce Self-Heating in 22FDX® MOSFETs

   Halder, Arka[UCL] Nyssens, Lucas[UCL] Lederer, Dimitri[UCL] Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 207, p. 108706 (2023)
5. • Journal article

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   Accurate determination of stiffness and strength of graphene via AFM-based membrane deflection

   Bahrami, Farzaneh[UCL] Malik, Mohammad Wasil[UCL] Van Loock, Frederik[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Nysten, Bernard[UCL] (2023) Measurement Science and Technology — Vol. 34, no.12, p. 125027 (2023)
6. • Journal article

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   Raman Strain-Shift Measurements and Prediction from First-Principles in Highly-Strained Silicon

   Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2023) Journal of Materials Science: Materials in Electronics — Vol. 34, p. 373 (2023)
7. • Speech

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   Tuning the stochasticity of VO2 neurons firing-threshold through grain size engineering

   Bidoul, Noémie[UCL] Huet, Benjamin[UCL] Ureña Begara, Ferran[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2023) NeuMatDeCaS 2023 — Valencia, Spain
8. • Speech

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   C-V Measurement and Modeling of Double-BOX Trap-Rich SOI Substrate

   Huang, Yang[UCL] Yan, Yiyi[UCL] Nabet, Massinissa[UCL] Liu, Fanyu Li, Bo Li, Binhong Han, Zhengsheng Nguyen, Bich-Yen Cristoloveanu, Sorin Raskin, Jean-Pierre[UCL] (2023) 9th Joint Intl EuroSOI Workshop and International Conf On Ultimate Integration on Silicon 2023 — Tarragona, Spain
9. • Speech

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   Accurate determination of stiffness and strength of graphene via AFM-based membrane deflection

   Bahrami, Farzaneh[UCL] Malik, Mohammad Wasil[UCL] Van Loock, Frederik[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Nysten, Bernard[UCL] (2023) Forum 2023 des microscopies à sonde locale — Obernai, France
10. • Journal article

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    The Environmental Footprint of IC Production: Review, Analysis and Lessons from Historical Trends

    Pirson, Thibault[UCL] Delhaye, Thibault P.[UCL] Pip, Alex[UCL] Brun, Gregoire Le[UCL] Raskin, Jean-Pierre[UCL] Bol, David[UCL] (2023) IEEE Transactions on Semiconductor Manufacturing — Vol. 36, p. 56-67 (2023)
11. • Journal article

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    High-resistivity with PN interface passivation in 22 nm FD-SOI technology for low-loss passives at RF and millimeter-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Nabet, Massinissa[UCL] Schwan, C. Zhao, Z. Lhemann, S. Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 205 (2023)
12. • Speech

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    Improving the determination of strain in the deformed Silicon measured by Raman spectroscopy

    Francis, Laurent[UCL] Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) International Meeting on Optical Measurement Techniques and Industrial Applications — Delft (Netherlands)
13. • Journal article

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    Double Buried Oxide Trap-Rich Substrates for High Frequency Applications

    Nabet, Massinissa[UCL] Rack, Martin[UCL] Yan, Yiyi[UCL] Nguyen, Bich-Yen Raskin, Jean-Pierre[UCL] (2023) IEEE Electron Device Letters — , p. 1-1 (2023)
14. • Journal article

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    Probe-Dependent Residual Error Analysis for Accurate On-Wafer MOSFET Measurements up to 110 GHz

    L. Nyssens Ma, Shiqi[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) IEEE Journal of the Electron Devices Society — Vol. 11, no.11, p. 650 - 657 (2023)
15. • Speech

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    GaN-on-Porous Silicon for RF Applications

    Scheen, Gilles Tuyaerts, Romain[UCL] Cardinael, Pieter[UCL] Ekoga, Enriqué Aouadi, Khaled Pavageau, Christophe Rassekh, Amin Nabet, Massinissa[UCL] Yadav, Sachin Raskin, Jean-Pierre[UCL] Parvais, Bertrand Emam, Mostafa (2023) 2023 53rd European Microwave Conference (EuMC) — Berlin, Germany
16. • BookChapter

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    Impact of a High-resistivity Substrate on RF and mm-wave Performance of 22 nm FD-SOI Devices and Circuits

    Rack, Martin;[UCL] Nyssens, Lucas;[UCL] Nabet, Massinissa[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) Technologies Enabling Future Mobile Connectivity & Sensing — [ISBN : 9781032633039]
17. • Speech

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    Sub-mmWave Transmission Lines on Silicon-Based Technologies

    Ma, Shiqi[UCL] L. Nyssens Raskin, Jean-Pierre[UCL] Lederer, Dimitri[UCL] (2023) 53rd European Microwave Conference — Berlin, Germany
18. • Journal article

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    Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack

    Yan, Yiyi[UCL] Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) Solid State Electronics — Vol. 207, no.207 (2023)
19. • Journal article

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    C-V measurement and modeling of double-BOX Trap-Rich SOI substrate

    Huang, Yang[UCL] Yan, Yiyi[UCL] Nabet, Massinissa[UCL] Liu, Fanyu Li, Bo Li, Binhong Han, Zhengsheng Nguyen, Bich-Yen Cristoloveanu, Sorin Raskin, Jean-Pierre[UCL] (2023) Solid-State Electronics — Vol. 209, p. 108763 (2023)
20. • Speech

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    Verification of Reference Impedance from Common On-Wafer Calibrations on Commercial Calibration Substrates

    L. Nyssens Rack, Martin[UCL] Tuyaerts, Romain[UCL] Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2023) 101st ARFTG Microwave Measurement Conference (ARFTG) — San Diego, USA
21. • Speech

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    Near-IR response of highly-strained Si photodetector linking first principles and TCAD

    Roisin, Nicolas[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2023) ESSDERC-ESSCIRC 2023 — Lisbon
22. • Speech

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    The Concept of a Large-scale Subharmonic Coherent Detector Array at 600 GHz

    Tian, Zhenming Zhang, Meng Ma, Shiqi[UCL] Sievert, Benedikt Yuan, Hui Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] Roskos, Hartmut Erni, Daniel Rennings, Andreas (2023) 2023 Asian Pacific Microwave Conference — Taiwan
23. • Speech

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    RF figures of merit of polysilicon trap-rich layers formed locally by ion amorphization and nanosecond laser annealing

    Perrosé, M. Acosta Alba, P. Moulin, Maxime[UCL] Augendre, E. Lugo, J. Raskin, Jean-Pierre[UCL] Reboh, S. (2023) IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF 2023 — Las Vegas, Nevada, USA
24. • Speech

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    Band gap narrowing in highly-strained silicon beams observed using photoluminescence spectroscopy

    Roisin, Nicolas[UCL] Colla, Marie-Stéphane[UCL] Scaffidi, Romain[UCL] Pardoen, Thomas[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2023) BePOM 2023 — Bruxelles
25. • Speech

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    Post-fab porosification : challenges and advances

    Scheen, Gilles[UCL] Tuyaerts, Romain[UCL] Van Overmeere, Quentin[UCL] Whyte Ferreira, Clara[UCL] Rasson, Jonathan[UCL] Raskin, Jean-Pierre[UCL] (2023) SCOPe 2023 — Louvain-la-Neuve, Belgium

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