Iniguez, Benjamin
[UCL]
Raskin, Jean-Pierre
[UCL]
Demeûs, Laurent
[UCL]
Nève de Mévergnies, Amaury
[UCL]
Goffioul, Michael
[UCL]
Simon, Pascal
[UCL]
Vanhoenacker-Janvier, Danielle
[UCL]
Flandre, Denis
[UCL]
We present a submicron RF fully-depleted SOI MOSFET macro-model based on a complete extrinsic small-signal equivalent circuit and an improved CAD model for the intrinsic device. The delay propagation effects in the channel are modeled by splitting the intrinsic transistor into a series of shorter transistors, for each of which a quasi-static device model can be used. Since the intrinsic device model is charge-based, our RF SOI MOSFET model can be used in both small and large-signal analyses. The model has been validated for frequencies up to 40 GHz and effective channel lengths down to 0.16 mu m.
Bibliographic reference |
Iniguez, Benjamin ; Raskin, Jean-Pierre ; Demeûs, Laurent ; Nève de Mévergnies, Amaury ; Goffioul, Michael ; et. al. A new fully-depleted SOI MOSFET macro-model valid from DC to RF.Tenth International Symposium on Silicon-on-Insulator Technology and Devices (Washington, DC (USA), du 25/03/2001 au 30/03/2001). In: Electrochemical Society. Proceedings, no. 3, p. 193-198 (March 2001)In: Proceedings of the Tenth International Symposium on Silicon-on-Insulator Technology and Devices, Electrochemical Society, Inc.2001 |
Permanent URL |
http://hdl.handle.net/2078.1/96920 |