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Exploring the feasibility of low cost fault injection attacks on sub-threshold devices through an example of a 65nm AES implementation

Bibliographic reference Barenghi, Alessandro ; Hocquet, Cédric ; Bol, David ; Standaert, François-Xavier ; Regazzoni, Francesco ; et. al. Exploring the feasibility of low cost fault injection attacks on sub-threshold devices through an example of a 65nm AES implementation.Proceedings of the RFIDSec Workshop on RFID Security and Privacy (2011).
Permanent URL http://hdl.handle.net/2078.1/87572