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On-wafer wideband characterization of advanced MOS technologies

Bibliographic reference Raskin, Jean-Pierre. On-wafer wideband characterization of advanced MOS technologies.1st European Microwave Integrated Circuits Conference (Manchester, UK, 10-13 September 2006). In: 1st European Microwave Integrated Circuits Conference (IEEE Cat.No.06EX1410), IEEE2006, p.4 pp.
Permanent URL http://hdl.handle.net/2078.1/67899