Duclaux, Laurent
[UCL]
Nysten, Bernard
[UCL]
Issi, Jean-Paul
[UCL]
Moore, A. W.
The microstructure and morphology of three samples of pyrolytic boron nitride deposited at different temperatures have been characterized with use of x-ray diffraction and thermal-conductivity measurements. The x-ray analysis allowed the determination of the mean interlayer spacing, the out-of-plane coherence length, and the crystallites preferred orientation. It revealed the presence of three distinct morphologies. The thermal conductivity was measured as a function of temperature in the range 1. 5 < T < 300 K. The temperature variations of the thermal conductivity were fitted by using a model previously developed for the analysis of the thermal conductivity of graphites and carbons. This fit allowed the determination of the in-plane coherence length. It also allowed the analysis of point-defect concentration and of the interlayer shear modulus. It is shown that low-temperature thermal-conductivity measurements may be used to complement x-ray diffraction data for the microstructural characterization of materials.
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Bibliographic reference |
Duclaux, Laurent ; Nysten, Bernard ; Issi, Jean-Paul ; Moore, A. W.. Structure and Low-temperature Thermal-conductivity of Pyrolytic Boron-nitride. In: Physical Review. B, Condensed Matter, Vol. 46, no. 6, p. 3362-3367 (1992) |
Permanent URL |
http://hdl.handle.net/2078.1/50281 |