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A revised reverse gated-diode technique for determining generation parameters in thin-film silicon-on-insulator devices and its application at high temperatures

Bibliographic reference Rudenko, Tamara ; Flandre, Denis ; Kilchytska, Valeriya ; Dessard, Vincent. A revised reverse gated-diode technique for determining generation parameters in thin-film silicon-on-insulator devices and its application at high temperatures. In: Journal of Applied Physics, Vol. 97, no. 9, p. 9 pages (2005)
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