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Imaging Dirac fermions flow through a circular Veselago lens

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Brun-Barrière, Boris [UCL] MOREAU, Nicolas [UCL] Somanchi, S. Nguyen, Viet-Hung [UCL] Watanabe, K. [National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan] Charlier, Jean-Christophe [UCL] Hackens, Benoît [UCL]

Graphene charge carriers behave as relativistic massless fermions, thereby exhibiting a variety of counterintuitive behaviors. In particular, at p-n junctions, they behave as photons encountering a negative index media,therefore xperiencing a peculiar refraction known as Veselago lensing. However, the way Dirac fermions flow through a Veselago lens remains largely unexplored experimentally. Here, an approach to create a movable and tunable circular p-n junction in graphene is proposed, using the polarized tip of a scanning gate microscope. Scanning the tip in the vicinity of a graphene constriction while recording the device conductance yields images related to the electron flow through a circular Veselago lens, revealing a high current density in the lens core, as well as two low current density zones along the transport axis. Tight-binding simulations reveal the crucial role of the p-n junction smoothness on these phenomena. The present research adds dimensions in the control and understanding of Dirac fermions optical elements, a prerequisite to engineer relativistic electron optics devices

Document type Article de périodique (Journal article) – Article de recherche
Access type Accès libre
Publication date 2019
Language Anglais
Journal information "Physical Review B" - Vol. 100, no.4, p. 0414011 (2019)
Peer reviewed yes
Publisher American Physical Society (APS)
issn 2469-9950
e-issn 2469-9969
Publication status Publié
Affiliations UCL - SST/IMCN/NAPS - Nanoscopic Physics
UCL - SST/IMCN/MODL - Modelling
Links
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Bibliographic reference Brun-Barrière, Boris ; MOREAU, Nicolas ; Somanchi, S. ; Nguyen, Viet-Hung ; Watanabe, K. ; et. al. Imaging Dirac fermions flow through a circular Veselago lens. In: Physical Review B, Vol. 100, no.4, p. 0414011 (2019)
Permanent URL http://hdl.handle.net/2078.1/219458