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Characterization and Modeling of Single Event transients in LDMOS-SOI technology

Bibliographic reference Alvarado Pulido, José Joaquin ; Kilchytska, Valeriya ; Flandre, Denis. Characterization and Modeling of Single Event transients in LDMOS-SOI technology.MOS-AK/ESSDERC/ESSCIRC Workshop 2009 (Athens (Greece), du 14/09/2009 au 18/09/2009). In: Proceedings of the MOS-AK/ESSDERC/ESSCIRC Workshop 2009, 2009
Permanent URL http://hdl.handle.net/2078.1/130535