Flandre, Denis
[UCL]
Bulteel, Olivier
[UCL]
Gosset, Geoffroy
[UCL]
Haddad, Pierre-Antoine
[UCL]
Bernard, Sébastien
[UCL]
Rue, Bertrand
[UCL]
Bol, David
[UCL]
We introduce a disruptive ultra-low-leakage design technique, based on a pair of source-connected n- and p-MOSFETs, auto-biasing the stand-by gate-to-source voltage of the nMOSFET at negative voltage and that of the p-device at positive, thereby pushing the off current of analog and digital functions towards its physical limits, without reducing functional performance. Therefrom, we designed ultra-low-power basic blocks (2-terminal diode, 3-terminal transistor, voltage follower), circuits (7-transistor SRAM and MTCMOS latch with record low leakage but still high speed), as well as microsystems (e.g. high-frequency power-management units for RF and PV energy harvesting and micro
Bibliographic reference |
Flandre, Denis ; Bulteel, Olivier ; Gosset, Geoffroy ; Haddad, Pierre-Antoine ; Bernard, Sébastien ; et. al. Disruptive ultra-low-leakage design techniques for ultra-low-power CMOS circuits.CMOS Emerging Technologies Conference (Vancouver (Canada), du 18/07/2012 au 20/07/2012). In: Proceedings of the CMOS Emerging Technologies Conference, 2012 |
Permanent URL |
http://hdl.handle.net/2078.1/129374 |