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Accurate SOI MOSFET Characterization at Microwave Frequencies

Bibliographic reference Raskin, Jean-Pierre ; Dambrine, Gilles ; Vanhoenacker-Janvier, Danielle. Accurate SOI MOSFET Characterization at Microwave Frequencies. In: Electron Technology, Vol. 32, no.1/2, p. 72-80 (1999)
Permanent URL http://hdl.handle.net/2078.1/122091