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3D simulation and measurement of very narrow AM and IM triple-gate MOSFETs

Bibliographic reference Yan, Ran ; Afzalian, Aryan ; Lee, Chi-Woo ; Dehdashti Akhavan, Nima ; Xiong, Weize ; et. al. 3D simulation and measurement of very narrow AM and IM triple-gate MOSFETs.2008 China-Ireland International Conference on Information and Communication Technologies (CIICT 2008) (Beijing (China), du 26/09/2008 au 28/09/2008). In: Proceedings of the 2008 China-Ireland International Conference on Information and Communication Technologies (CIICT 2008), Curran Associates, Inc.2008, p. 627-630
Permanent URL http://hdl.handle.net/2078.1/120912