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    Scanning gate microscopy on quantum rings: influence of the magnetic field and of charged defects
    Pala, M. Rodrigues Martins, Frederico[UCL] Hackens, Benoît[UCL] Baltazar, S. Sellier, H. Huant, S. Bayot, Vincent[UCL] (2009) International Conference on Electronic Properties of Two-dimensional Systems and Modulated Semiconductor Structures, EP2DS-18 — Kobe, Japan