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Displaying 8 results.
    • Journal article
    Experimental observations of surface roughness in uniaxially loaded strained Si microelectromechanical systems-based structures
    Escobedo-Cousin, Enrique Olsen, Sarah H. Pardoen, Thomas[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2011) Applied Physics Letters — Vol. 99, p. 241906 (2011)
    • Journal article
    Note: Fast and reliable fracture strain extraction technique applied to silicon at nanometer scale
    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Sodervall, Ulf Nilsson, Bengt Petersson, Goran Hagberg, Mats Raskin, Jean-Pierre[UCL] (2011) Review of Scientific Instruments — Vol. 82, p. 116106 (2011)
    • Speech
    Nanomechanical testing of free-standing monocrystalline silicon beams
    Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) 219th ECS Meeting - Symposium E8 - Advanced Semiconductor-on-Insulator Technology and Related Physics — Montreal, Canada
    • Journal article
    Characterizing the effect of uniaxial strain on the surface roughness of Si nanowire MEMS-based microstructures
    Escobedo-Cousin, E. Olsen, S.H. Pardoen, Thomas[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2011) MRS Proceedings, Micromechanical Systems - Materials and Devices — Vol. 1299, p. article 25 (2011)
    • Journal article
    Nanomechanical testing of free-standing monocrystalline silicon beams
    Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) ECS Transactions — Vol. 35, no. 5, p. 221-226 (May 2011)
    • Journal article
    On-chip tensile testing of the mechanical and electro-mechanical properties of nano-scale silicon free-standing beams
    Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Zulfiqar, Azeem[UCL] Sodervall, U. Nilsson, B. Peterson, G. Hagberg, M. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) Advanced Materials Research — Vol. 276, no. -, pp. 117-126 (2011)
    • Speech
    Nano-mechanical testing of free-standing mono-crystalline silicon beams
    Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) The 219th Electrochemical Society Meeting – ECS 2011 — Montreal, QC, Canada
    • Speech
    High throughput lab-on-chip for testing the mechanical properties of thin films
    Ryelandt, Sophie[UCL] Carbonnelle, Pierre[UCL] Coulombier, Michaël[UCL] Colla, Marie-Stéphane[UCL] Houri, Samer[UCL] Zeb, G.[UCL] Zulfiqar, A.[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2011) European Congress on Advanced Materials and Processes – EuroMAT 2011 — Montpellier, France