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1. • Speech

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   Surface effects on the electrical, mechanical and electro-mechanical properties of silicon nano wires

   Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Passi, Vikram Houri, S. Raskin, Jean-Pierre[UCL] (2013) 2013 MRS Spring Meeting & Exhibit — San Francisco, California, USA
2. • Speech

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   On-Chip tensile testing of the mechanical and electro-mechanical properties of nano-scale silicon free-standing beams up to fracture

   Raskin, Jean-Pierre[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] (2013) PiezoNEMS 2013 - PHELMA-Polygone — Grenoble, France
3. • Speech

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   Surface and stress effects on the electrical conductivity of nano-scale silicon

   Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) 2012 MRS Fall Meeting & Exhibit — Boston, Massachusetts, UDA
4. • Journal article

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   A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects

   Pardoen, Thomas[UCL] Colla, Marie-Stéphane[UCL] Idrissi, Hosni[UCL] Amin-Ahmadi, Behnam Wang, Binjie Schryvers, Dominique Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2016) Comptes rendus. Physique — Vol. 17, no.3-4, p. 485-495 (2016)
5. • Journal article

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   Note: Size effects on the tensile response of top-down fabricated Si nanobeams

   Houri, S. Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2013) Review of Scientific Instruments — Vol. 84, no.3, p. 036102 (2013)
6. • Journal article

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   Surface states and conductivity of silicon nano-wires

   Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Passi, Vikram Raskin, Jean-Pierre[UCL] (2013) Journal of Applied Physics — Vol. 113, no.13, p. 134502 (2013)
7. • Journal article

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   High-Throughput On-Chip Large Deformation of Silicon Nanoribbons and Nanowires

   Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Sodervall, Ulf Nilsson, Bengt Petersson, Goran Hagberg, Mats Raskin, Jean-Pierre[UCL] (2012) IEEE Journal of Microelectromechanical Systems — Vol. 21, no.4, p. 822-829 (August 2012)
8. • Journal article

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   Strain in silicon nanowire beams

   Urena, F. Olsen, S.H. Šiller, L. Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) Journal of Applied Physics — Vol. 112, no. 11, p. 114506 (2012)
9. • Journal article

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   Piezoresistance of nano-scale silicon up to 2GPa in tension

   Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Passi, Vikram Raskin, Jean-Pierre[UCL] (2013) Applied Physics Letters — Vol. 102, no.3, p. 031911 (2013)
10. • Speech

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    On-chip testing of (freestanding) thin films

    Pardoen, Thomas[UCL] Coulombier, Michaël[UCL] Colla, Marie-Stéphane[UCL] Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Houri, Samer[UCL] Raskin, Jean-Pierre[UCL] Idrissi, Hosni[UCL] (2012) Indentation 2012 — Ecully, France
11. • Speech

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    Application of process induced stress to study the mechanical properties of monocrystalline and amorphous silicon thin films

    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2010) Nanomechanical Testing Workshop and Hysitron User Meeting — INM, Saarbrücken, Germany
12. • Journal article

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    Experimental observations of surface roughness in uniaxially loaded strained Si microelectromechanical systems-based structures

    Escobedo-Cousin, Enrique Olsen, Sarah H. Pardoen, Thomas[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2011) Applied Physics Letters — Vol. 99, p. 241906 (2011)
13. • Journal article

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    Note: Fast and reliable fracture strain extraction technique applied to silicon at nanometer scale

    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Sodervall, Ulf Nilsson, Bengt Petersson, Goran Hagberg, Mats Raskin, Jean-Pierre[UCL] (2011) Review of Scientific Instruments — Vol. 82, p. 116106 (2011)
14. • Speech

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    On-chip tensile testing for the investigation of thin films, nanoribbons and nanowires mechanical properties

    Vayrette, Renaud[UCL] Coulombier, Michaël[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2012) Journées de la Matière Condensée - JMC13 — Montpellier, France
15. • Journal article

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    Dynamic analysis of multi-beam MEMS structures for the extraction of the stress-strain response of thin films

    Houri, Samer[UCL] Bhaskar, Umesh Kumar[UCL] Gallacher, B. Francis, Laurent[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2013) Experimental Mechanics : an international journal of the Society for Experimental Mechanics — Vol. 53, no. 3, p. 441-453 (March 2013)
16. • Speech

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    On chip testing of (freestanding) thin films

    Pardoen, Thomas[UCL] Coulombier, Michaël[UCL] Colla, Marie-Stéphane[UCL] Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Houri, Samer[UCL] Raskin, Jean-Pierre[UCL] Idrissi, Hosni[UCL] (2012) GDRi CNRS MECANO, Session I, Mechanical Testing — Paris, France
17. • Speech

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    Lab-on-chips based testing methods to investigate the mechanical behavior of nanofilms

    Carbonnelle, Pierre[UCL] Ryelandt, Sophie[UCL] Boe, Alexandre[UCL] Coulombier, Michaël[UCL] Zulfiqar, Azeem[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] (2010) European Conference on Nano Film - ECNF'10 — Liège, Belgium
18. • Speech

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    Nanomechanical testing of free-standing monocrystalline silicon beams

    Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) 219th ECS Meeting - Symposium E8 - Advanced Semiconductor-on-Insulator Technology and Related Physics — Montreal, Canada
19. • Speech

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    Mechanical and electromechanical on-chip testing of mono- and poly-crystalline silicon nanobeams

    Raskin, Jean-Pierre[UCL] Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Zulfiqar, Azeem[UCL] Pardoen, Thomas[UCL] (2010) 2010 Materials Research Society Fall Meeting - MRS Fall'10 — Boston, MA, USA
20. • Journal article

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    On-chip tensile testing of nanoscale silicon free-standing beams

    Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Houri, Samer[UCL] Escobedo-Cousin, Enrique Olsen, Sarah H. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2012) Journal of Materials Research — Vol. 27, no. 3, p. 571-579 (Feb. 2012)
21. • Journal article

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    Characterizing the effect of uniaxial strain on the surface roughness of Si nanowire MEMS-based microstructures

    Escobedo-Cousin, E. Olsen, S.H. Pardoen, Thomas[UCL] Bhaskar, Umesh Kumar[UCL] Raskin, Jean-Pierre[UCL] (2011) MRS Proceedings, Micromechanical Systems - Materials and Devices — Vol. 1299, p. article 25 (2011)
22. • Journal article

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    Nanomechanical testing of free-standing monocrystalline silicon beams

    Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) ECS Transactions — Vol. 35, no. 5, p. 221-226 (May 2011)
23. • Journal article

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    On-chip tensile testing of the mechanical and electro-mechanical properties of nano-scale silicon free-standing beams

    Bhaskar, Umesh Kumar[UCL] Passi, Vikram[UCL] Zulfiqar, Azeem[UCL] Sodervall, U. Nilsson, B. Peterson, G. Hagberg, M. Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) Advanced Materials Research — Vol. 276, no. -, pp. 117-126 (2011)
24. • Speech

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    Fabrication process for applying high mechanical stress on monocrystalline silicon film

    Passi, Vikram[UCL] Bhaskar, Umesh Kumar[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2010) 6th International SemOI Conference and 1st Ukrainian-French Seminar “Semiconductor-on-Insulator materials, devices and circuits: physics, technology and diagnostics” — Kyiv, Ukraine
25. • Speech

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    Nano-mechanical testing of free-standing mono-crystalline silicon beams

    Bhaskar, Umesh Kumar[UCL] Houri, Samer[UCL] Passi, Vikram[UCL] Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] (2011) The 219th Electrochemical Society Meeting – ECS 2011 — Montreal, QC, Canada

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