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Displaying 11 results.
    • Speech
    Characterization of SOI MOSFETs by gate capacitance measurements
    Flandre, Denis[UCL] Gentinne, Bernard[UCL] (1993) IEEE International Conference on Microelectronic Test Structures (ICMTS 1993) — Sitges (Spain)
    • Journal article
    Noise modeling in fully depleted SOI MOSFETs
    Pailloncy, G. Iniguez, B. Dambrine, G. Raskin, Jean-Pierre[UCL] Danneville, F. (2004) Solid-State Electronics — Vol. 48, no. 5, p. 813-825 (2004)
    • Journal article
    Characteristics of Nmos/gaa (gate-all-around) Transistors Near Threshold
    Francis, Pascale[UCL] Flandre, Denis[UCL] Terao, Akira[UCL] Vandewiele, Fernand[UCL] (1992) Microelectronic Engineering — Vol. 19, no. 1-4, p. 815-818 (1992)
    • Journal article
    On the high-temperature subthreshold slope of thin-film SOI MOSFETs
    Rudenko, Tamara Flandre, Denis[UCL] Kilchytska, Valeriya[UCL] Colinge, Jean-Pierre[UCL] Dessard, Vincent[UCL] (2002) IEEE Electron Device Letters — Vol. 23, no. 3, p. 148-150 (March 2002)