All Publications

Pages

1. • Journal article

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   LDMOS in SOI technology with very-thin silicon film

   Bawedin, Maryline[UCL] Flandre, Denis[UCL] Renaux, Christian[UCL] (2004) Solid-State Electronics — Vol. 48, no. 12, p. 2263-2270 (2004)
2. • Journal article

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   Compact diamond MOSFET model accounting for PAMDLE applicable down 150nm node

   Gimenez, Salvador Pinillos Davini, Enrico Peruzzi, Vinicius Renaux, Christian[UCL] Flandre, Denis[UCL] (2014) Electronics Letters — Vol. 50, no. 22, p. 1618-1620 (23/10/2014)
3. • Journal article

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   Boosting the SOI MOSFET Electrical Performance by Using the Octogonal Layout Style in High Temperature Environment

   Galembeck, Egon H.S. Renaux, Christian[UCL] Flandre, Denis[UCL] Finco, Saulo Gimenez, Salvador P. (2017) IEEE Transactions on Device and Materials Reliability — Vol. 17, no.1, p. 1-8 (03/2017)
4. • Journal article

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   Diamond layout style impact on SOI MOSFET in high temperature environment

   Gimenez, Salvador Pinillos Galembeck, Egon Henrique Salerno Renaux, Christian[UCL] Flandre, Denis[UCL] (2015) Microelectronics Reliability — Vol. MR_11492, p. 6 (13/03/2015)
5. • Speech

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   Using Statistical Student's t-Test to Qualify the Electrical Performance of the Diamond MOSFETs

   Vono Peruzzi, Vinicius da Silva, Gabriel Augusto Renaux, Christian[UCL] Flandre, Denis[UCL] Pinillos Gimenez, Salvador (2018) 2018 33rd Symposium on Microelectronics Technology and devices (SBMicro 2018) — Bento Gonçalves, Rio Grande do Sul (Brazil )
6. • Journal article

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   Experimental Validation of the Drain Current Analytical Model of the Fully Depleted Diamond SOI nMOSFETs by Using Paired T-test Statistical Evaluation

   Peruzzi, V.V. Renaux, Christian[UCL] Flandre, Denis[UCL] Gimenez, S.P. (2012) ECS Transactions — Vol. 49, no.1, p. 169-176 (2012)
7. • Journal article

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   The Impact of LCE and PAMDLE Regarding Different CMOS ICs Nodes and High Temperatures

   GALEMBECK, EGON HENRIQUE SALERNO Renaux, Christian[UCL] SWART, JACOBUS WILLIBRORDUS Flandre, Denis[UCL] GIMENEZ, SALVADOR PINILLOS (2021) I E E E Journal of the Electron Devices Society — Vol. 9, p. 415-423 (2021)
8. • Speech

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   A review of fully-depleted SOI CMOS technology for microsystems

   Demeûs, Laurent[UCL] Delatte, Pierre[UCL] Dessard, Vincent[UCL] Adriaensen, Stéphane[UCL] Renaux, Christian[UCL] Flandre, Denis[UCL] (2000) 3rd International Conference on Micro Materials — Berlin (Germany)
9. • Speech

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   Fully depleted SOI CMOS technology for heterogeneous micropower, high-temperature or RF microsystems

   Flandre, Denis[UCL] Adriaensen, Stéphane[UCL] Akheyar, A. Crahay, André[UCL] Demeus, L. Delatte, Pierre[UCL] Dessard, V. Iniguez, B.[UCL] Neve, A.[UCL] Katschmarskyj, Bohdan[UCL] Loumaye, Pierre[UCL] Laconte, J.[UCL] Martinez, I[UCL] Picun, G.[UCL] Rauly, E.[UCL] Renaux, Christian[UCL] Spote, David[UCL] Zitout, Miloud[UCL] Dehan, Morin[UCL] Parvais, Bertrand[UCL] Simon, Pascal[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2001) European Meeting on Silicon-on-Insulator Devices (EUROSOI-2000) — Granada (Spain)
10. • Speech

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    Charge Sensitive Amplifier Study in 2μm FD SOI CMOS

    Soung Yee, Lawrence[UCL] Martin, Elena[UCL] Cortina Gil, Eduardo[UCL] Renaux, Christian[UCL] Flandre, Denis[UCL] (2011) IEEE International SOI Conference (SOI 2011) — Tempe (USA)
11. • Speech

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    New experiments on the electrodeposition of iron in porous silicon

    Renaux, Christian[UCL] Scheuren, Vinciane[UCL] Flandre, Denis[UCL] (1999) 10th Workshop on dielectrics in microelectronics — Barcelona (Spain)
12. • Speech

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    Low-noise SOI Hall devices

    Haddab, Youcef Mosser, Vincent Lysowec, Mélanie Suski, Jan Demeûs, Laurent[UCL] Renaux, Christian[UCL] Adriaensen, Stéphane[UCL] Flandre, Denis[UCL] (2003) SPIE Fluctuations and Noise Symposium — Santa Fe (USA)
13. • Speech

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    IF MEMS Filters for Mobile Communication

    Quévy, E. Galayko, D. Legrand, B. Renaux, Christian[UCL] Combi, C. Flandre, Denis[UCL] Buchaillot, L. Collard, D. Vigna, B. Kaiser, A. (2001) 8th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA’01) — Antibes Juan-les-pins (France)
14. • Speech

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    MEMS for mobile communication

    Quévy, E. Renaux, Christian[UCL] Buchaillot, L. Flandre, Denis[UCL] Collard, D.[UCL] (2001) 13th European Microelectronics and Packaging Conference and Exhibition (IMAPS’01) — Strasbourg (France)
15. • Journal article

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    Low-Noise SOI Hall Devices

    Haddab, Youssef Mosser, Vincent Lysowec, Mélanie Suski, Jan Demeûs, Laurent[UCL] Renaux, Christian[UCL] Adriaensen, Stéphane[UCL] Flandre, Denis[UCL] (2004) Fluctuation and Noise Letters : an interdisciplinary scientific journal on random processes in physical, biological and technological systems — Vol. 4, no. 2, p. L345-L354 (2004)
16. • Speech

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    Integrated sensors and electronic circuits in SOI technology for high-temperature applications

    Dessard, Vincent[UCL] Demeûs, Laurent[UCL] Viviani, A.[UCL] Adriaensen, Stéphane[UCL] Binard, C.[UCL] Crahay, André[UCL] Renaux, Christian[UCL] Loumaye, Pierre[UCL] Spote, David[UCL] Flandre, Denis[UCL] Katschmarskyj, Bohdan[UCL] (1998) Forum Microsystems — Liège (Belgium)
17. • Patent

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    Double-gate floating-body memory device

    Bawedin, Maryline[UCL] Cristoloveanu, Sorin Ioan Flandre, Denis[UCL] Renaux, Christian[UCL] Crahay, André[UCL] (2013)
18. • Speech

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    Characterization of FD-SOI MOSFETs based on EKV model

    Tomaszewski, Daniel Flandre, Denis[UCL] Renaux, Christian[UCL] Grabiec, Piotr Kociubinski, Andrzej Kucharski, Krzysztof (2005) MOS-AK Workshop 2005 — Grenoble (France)
19. • Speech

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    Comparative Experimental Study of X-Ray Radiation Effects in the Threshold Voltage between the OCTO and Conventional SOI nMOSFETs

    de Souza Fino, Leonardo Navarenho Aparecida Guazzelli da Silveira, Marcilei Renaux, Christian[UCL] Flandre, Denis[UCL] Gimenez, Salvador Pinillos (2013) VIII Workshop on Semiconductors and Micro & Nano Technology (Seminatec 2013) — Campinas (Brazil)
20. • Journal article

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    Experimental Study of the OCTO SOI nMOSFET and Its Application in Analog Integrated Circuits

    Fino, L.N.S. Renaux, Christian[UCL] Flandre, Denis[UCL] Gimenez, P. (2012) ECS Transactions — Vol. 49, no.1, p. 527-534 (2012)
21. • Journal article

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    Influence of Device Geometry on SOI Single-Hole Transistor Characteristics

    Tang, Xiaohui[UCL] Baie, Xavier Colinge, Jean-Pierre Loumaye, Pierre[UCL] Renaux, Christian[UCL] Bayot, Vincent[UCL] (2001) Microelectronics Reliability — Vol. 41, no. 11, p. 1841-1846 (2001)
22. • Journal article

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    New experiments on the electrodeposition of iron in porous silicon

    Renaux, Christian[UCL] Scheuren, V[UCL] Flandre, Denis[UCL] (1999) Microelectronics Reliability — Vol. 40, no. 4-5, p. 877-879 (2000)
23. • Journal article

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    Interface investigations of iron and cobalt metallized porous silicon: AES and FTIR analyses

    Hamadache, F. Renaux, Christian[UCL] Duvail, JL Bertrand, Patrick[UCL] (2003) Physica Status Solidi. A: Applied Research — Vol. 197, no. 1, p. 168-174 (2003)
24. • Journal article

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    The Influence of Back Gate Bias on the OCTO SOI MOSFET's Response to X-ray Radiation

    N. de S. Fino, Leonardo A. G. Silveira, Marcilei Renaux, Christian[UCL] Flandre, Denis[UCL] Pinillos Gimenez, Salvador (2015) Journal of Integrated Circuits and Systems — Vol. 10, no.1, p. 43-48 (2015)
25. • Journal article

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    Digital Performance of OCTO Layout Style on SOI MOSFET at High Temperature Environment

    Salerno Galembeck, Egon Henrique Flandre, Denis[UCL] Renaux, Christian[UCL] Pinillos Gimenez, Salvador (2019) Journal of Integrated Circuits and Systems — Vol. 14, no.2, p. 8 (2019)

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