All Publications

Pages

1. • Speech

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   Mechanical properties of anodic aluminum oxide for microelectromechanical system applications

   Moreno Hagelsieb, Luis[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2008) 15th Workshop on Dielectrics in Microelectronics (WoDiM 2008) — Bad Saarow (Germany)
2. • Speech

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   Body-biasing control on zero-temperature-coefficient in partially depleted SOI MOSFET

   El Kaamouchi, Majid[UCL] Dambrine, G. Si Moussa, M. Emam, Mostafa[UCL] Vanhoenacker-Janvier, Danielle[UCL] Raskin, Jean-Pierre[UCL] (2008) 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems — Orlando, FL, USA
3. • Journal article

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   Low-Power Silicon Strain Sensor Based on CMOS Current Reference Topology

   Roisin, Nicolas[UCL] Delhaye, Thibault[UCL] André, Nicolas[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2022) Low-Power Silicon Strain Sensor Based on CMOS Current Reference Topology — Vol. 339, no.113491, p. 1-11 (2022)
4. • Journal article

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   In-situ TEM irradiation creep experiment revealing radiation induced dislocation glide in pure copper

   Khiara, Nargisse Onimus, Fabien Jublot-Leclerc, Stéphanie Jourdan, Thomas Pardoen, Thomas[UCL] Raskin, Jean-Pierre[UCL] Bréchet, Yves (2021) Acta Materialia — Vol. 216, p. 117096 (2021)
5. • Journal article

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   Modeling of Semiconductor Substrates for RF Applications: Part I—Static and Dynamic Physics of Carriers and Traps

   Rack, Martin[UCL] Frédéric Allibert Raskin, Jean-Pierre[UCL] (2021) IEEE Transactions on Electron Devices — Vol. 68, no.9, p. 4598-4605 (2021)
6. • Speech

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   Multilayered absorber over K-and Ka-band based on graded concentration of carbon nanofillers: Modeling, Fabrication, and Experimental validation

   Delcorte, A.[UCL] Hermans, S.[UCL] Raskin, Jean-Pierre[UCL] Jaiswar, Rajkumar Rampati[UCL] Bailly, C. Huynen, Isabelle[UCL] (2018) URSI AP-RASC 2019, New Delhi, India, 09 - 15 March 2019 —
7. • Journal article

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   Charge-pumping characterization of SOI devices fabricated by means of wafer bonding over pre-patterned cavities

   Gluszko, G. Lukasiak, L. Kilchytska, Valeriya[UCL] Chung, Tsung Ming[UCL] Olbrechts, Benoit[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2007) Journal of Telecommunications and Information Technology — Vol. 3, p. 61-66 (2007)
8. • Patent

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   Fabrication method of semiconductor devices

   Nève, Amaury[UCL] Raskin, Jean-Pierre[UCL] Flandre, Denis[UCL] (2002)
9. • Speech

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   Accurate determination of stiffness and strength of graphene via AFM-based membrane deflection

   Bahrami, Farzaneh[UCL] Malik, Mohammad Wasil[UCL] Van Loock, Frederik[UCL] Raskin, Jean-Pierre[UCL] Pardoen, Thomas[UCL] Nysten, Bernard[UCL] (2023) Forum 2023 des microscopies à sonde locale — Obernai, France
10. • Journal article

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    Fundamental limitations for the transfer of graphene grown on Cu substrates

    HUET, Benjamin[UCL] Raskin, Jean-Pierre[UCL] Redwing, J. M. Snyder, D. W. (2020) Carbon — Vol. 163, p. 95-104 (2020)
11. • Journal article

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    High performance analog operation of double gate transistors with the graded-channel architecture at low temperatures

    Pavanello, Marcelo Antonio Flandre, Denis[UCL] Martino, Joao Antonio Raskin, Jean-Pierre[UCL] (2005) Solid-State Electronics — Vol. 49, no. 10, p. 1569-1575 (2005)
12. • Journal article

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    Effective resistivity extraction of low-loss silicon substrate at millimeter-wave frequencies

    Nyssens, Lucas[UCL] Rack, Martin[UCL] Raskin, Jean-Pierre[UCL] (2020) International Journal of Microwave and Wireless Technologies — Vol. 12, no.7, p. 615-628 (2020)
13. • Journal article

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    Numerical simulation of high-speed p-i-n photodiodes under large illumination power

    Torrese, G. Huynen, Isabelle[UCL] Raskin, Jean-Pierre[UCL] Vander Vorst, André[UCL] (2002) Acta Technica Belgica. Revue H F: Electricite Courants Faibles. Electronique Telecommunications — no. 2, p. 68-70 (2002)
14. • BookChapter

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    Special features of the back-gate effects in ultra-thin body SOI MOSFETs

    Rudenko, Tamara Kilchytska, Valeriya[UCL] Raskin, Jean-Pierre[UCL] Nazarov, Alexei Flandre, Denis[UCL] (2011) Semiconductor-On-Insulator Materials for NanoElectronics Applications —
15. • Speech

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    Substrate noise mitigation using high resistivity base silicon wafer for a 14 GHz VCO on 28 nm FD-SOI

    Bendou, Youssef[UCL] Rack, Martin[UCL] Lederer, Dimitri[UCL] cathelin, Andreia Raskin, Jean-Pierre[UCL] (2023) 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS) — Edinburgh, UK
16. • Journal article

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    Effective resistivity of fully-processed SOI substrates

    Lederer, Dimitri[UCL] Raskin, Jean-Pierre[UCL] (2005) Solid-State Electronics — Vol. 49, no. 3, p. 491-496 (2005)
17. • Journal article

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    Fabrication and Characterization of High Resistivity SOI Wafers for RF Applications

    Lederer, Dimitri[UCL] Roda Neve, Cesar[UCL] Olbrechts, Benoit[UCL] Raskin, Jean-Pierre[UCL] (2008) ECS Transactions — Vol. 16, no. 8, p. 165-174 (2008)
18. • Journal article

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    SOI technology: an opportunity for RF designers? (invited paper)

    Raskin, Jean-Pierre[UCL] (2009) Journal of Telecommunications and Information Technology — , no. 4, p. 3-17 (April 2009)
19. • Journal article

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    Liquid and vapor phase silanes coating for the release of thin film MEMS

    Parvais, Bertrand[UCL] Pallandre, A. Jonas, Alain M.[UCL] Raskin, Jean-Pierre[UCL] (2005) IEEE Transactions on Device and Materials Reliability — Vol. 5, no. 2, p. 250-254 (2005)
20. • Speech

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    Conception responsable de capteurs de qualité de l’eau

    Le Brun, Grégoire[UCL] Hauwaert, Margo[UCL] Adant, I. Raskin, Jean-Pierre[UCL] (2021) Conference on interdisciplinary and transdisciplinary research for sustainable development — Louvain-la-Neuve, Belgium
21. • Journal article

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    Characterization of the body node in PD SOI MOSFETs using multiport VNA measurements

    Lederer, Dimitri Raskin, Jean-Pierre[UCL] (2007) IEEE Transactions on Electron Devices — Vol. 54, no. 11, p. 3030-3039 (2007)
22. • Journal article

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    DC and AC analyses of novel SOI MOSFET devices using 2-D and 3-D numerical simulations

    Chung, Tsung Ming[UCL] Raskin, Jean-Pierre[UCL] (2006) International Journal of Nanoscience — Vol. 5, no. 4-5, p. 639-644 (May)
23. • Journal article

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    Silicon-on-Nothing MOSFETs: An efficient solution for parasitic substrate coupling suppression in SOI devices

    Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2008) Applied Surface Science — Vol. 254, no. 19, p. 6168-6173 (2008)
24. • Journal article

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    From Nanoelectronics towards Nanoelectromechanical Systems

    Raskin, Jean-Pierre[UCL] IKER, F. André, Nicolas[UCL] Fabrègue, Damien[UCL] Coulombier, Michaël[UCL] Pardoen, Thomas[UCL] (2007) Revue E Tijdschrift — Vol. 1, no. mars/avril 2007, p. 26-33 (2007)
25. • Journal article

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    An investigation of noise phenomena in fabricated fully-depleted Silicon-on-Insulator MOSFETs by means of ensemble Monte Carlo simulations

    Rengel, R. González, T. Mateos, Javier Pardo, D. Dambrine, Gilles Danneville, François Raskin, Jean-Pierre[UCL] Martin, M. J. (2006) IEEE Transactions on Electron Devices — Vol. 53, no. 3, p. 523-532 (March)

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