User menu

Accès à distance ? S'identifier sur le proxy UCLouvain

All Publications

Displaying 1 result.
    • Speech
    New evidence of interfacial oxide traps in n-type 4H- and 6H-SiC MOS structures
    Olafsson, H.O. Sveinbjornsson, E.O. Rudenko, Tamara Kilchytska, Valeriya[UCL] Tyagulski, I. Osiyuk, I. (2001) 2001 International conference on silicon carbide and related materials (ICSCRM 2001) — Tsukuba (Japan)