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All Publications

Displaying 10 results.
    • Speech
    Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications
    Ratajczak, J. Laszcz, A. Czerwinski, A. Katcki, J. Phillipp, F. Van Aken, P. A. Reckinger, Nicolas[UCL] Dubois, Emmanuel[UCL] (2010) 13th International Conference on Electron Microscopy — Zakopane(Poland)
    • Speech
    TEM Characterization of Polysilicon and Silicide Fin Fabrication Processes of FinFETs
    Ratajczak, J. Laszcz, A. Czerwinski, A. Katcki, J. Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Yarekha, Dmytro A. Larrieu, Guilem Dubois, Emmanuel (2009) 3rd National Conference on Nanotechnology — Warsaw(Poland)
    • Speech
    Transmission electron microscopy study of erbium silicide formation using a Pt/Er stack on a thin silicon-on-insulator substrate
    Laszcz, A. Jatcki, J. Ratajczak, J. Tang, Xiaohui[UCL] Dubois, Emmanuel (2005) XII International Conference on Electron Microscopy of Solids — Kazimierz Dolny (Poland)
    • Speech
    Characterization of ytterbium silicide formed in ultra high vacuum
    Laszcz, A. Ratajczak, J. Czerwinski, A. Katcki, J. Srot, V. Phillipp, F. van Aken, P.A. Yarekha, D. Reckinger, Nicolas[UCL] Larrieu, G. Dubois, Emmanuel[UCL] (2010) 16th International Conference on Microscopy of Semiconducting Materials — Oxford, UK
    • Speech
    Transmission electron microscopy study of erbium silicide formation using Pt/Er stack on a thin silicon-on-insulator substrate
    Laszcz, A. Katcki, J. Ratajczak, J. Tang, Xiaohui[UCL] Dubois, Emmanuel (2004) 13th European Microscopy Congress 2004 — Antwerpen (Belgium)
    • Journal article
    Transmission electron microscopy characterization of the erbium silicide formation process using a Pt/Er stack on a silicon-on-insulator substrate
    Laszcz, A. Katcki, J. Ratajczak, J. Tang, Xiaohui[UCL] Dubois, E.[UCL] (2006) Journal of Microscopy — Vol. 224, p. 38-41 (2006)
    • Speech
    Analysis of silicides formation for Schottky barrier contacts applications
    Katcki, J. Ratajczak, J. Laszcz, A. Czerwinski, A. Tang, Xiaohui[UCL] Larrieu, Guilhem Breil, Nicolas Yarheka, D. Dubois, Emmanuel (2008) 7th Polish-Japanese Joint Seminar on Micro and Nano Analysis 2008 — Warsaw (Poland)
    • Speech
    Metallic Source/Drain Architecture for Advanced MOS Technology: an overview of METAMOS results
    Dubois, Emmanuel Larrieu, Guilhem Breil, Nicolas Valentin, R. Danneville, F. Yarekha, D. Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Halimaoui, Aomar Rengel, R. Pascual, E. Pouydebasque, A. Wallart, X. Godey, S. Ratajczak, J. Laszcz, A. Katcki, J. Raskin, Jean-Pierre[UCL] Dambrine, Gilles Cros, A. Skotnicki, T. (2009) 8th Diagnostics & Yield Symposium — Warszaw (Poland)
    • Journal article
    TEM Characterization of Polysilicon and Silicide Fin Fabrication Processes of FinFETs
    Ratajczak, J. Laszcz, A. Czerwinski, A. Katcki, J. Tang, Xiaohui[UCL] Reckinger, Nicolas[UCL] Yarekha, N. Larrieu, Guillaume Dubois, Emmanuel (2009) Acta Physica Polonica. Series A: General Physics, Physics of Condensed Matter, Optics and Quantum Electronics, Atomic and Molecular Physics, Applied Physics — Vol. 116, no.98, p. 89-91 (2009)
    • Speech
    UHV fabrication of the ytterbium silicide as potential low Schottky barrier S/D contact material for n-type MOSFET
    Yarekha, Dmytro A. Larrieu, Guilhem Nreil, Nicolas Dubois, Emmanuel Godey, S. Wallart, X. Soyer, C. Remiens, D. Reckinger, Nicolas[UCL] Tang, Xiaohui[UCL] Laszcz, A. Ratajczak, J. Halimaoui, Aomar (2009) Meeting of the Electrochemical Society 2009 — San Francisco (USA)