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    Transmission electron microscopy study of erbium silicide formation using a Pt/Er stack on a thin silicon-on-insulator substrate
    Laszcz, A. Jatcki, J. Ratajczak, J. Tang, Xiaohui[UCL] Dubois, Emmanuel (2005) XII International Conference on Electron Microscopy of Solids — Kazimierz Dolny (Poland)