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Displaying 1 - 25 of 32 results.

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    • Speech
    Improvement of sub 0.25 µm fully-depleted SOI CMOS analog performance by thinning the Si film
    Nève de Mévergnies, Amaury[UCL] Dessard, Vincent[UCL] Delatte, Pierre[UCL] Brodeoux, V.[UCL] Iniguez, Benjamin[UCL] Rauly, E.[UCL] Flandre, Denis[UCL] (2001) Tenth International Symposium on Silicon-on-Insulator Technology and Devices — Washington, DC (USA)
    • Journal article
    Implementation of the symmetric doped double-gate MOSFET model in Verilog-A for circuit simulation
    Alvarado Pulido, José Joaquin[UCL] Iniguez, Benjamin Estrada, Magali Flandre, Denis[UCL] Cerdeira, Antonio (2009) International Journal of Numerical Modelling: Electronic Netwoks, Devices and Fields — Vol. 23, p. 88-106 (2009)
    • Speech
    A simple leakage drain current model for accumulation-mode SOI nMOSFETs operating up to 300°C
    Bellodi, Marcello Iniguez, Benjamin[UCL] Flandre, Denis[UCL] Martino, J.A. (2001) XVI SBMicro, International Conference on Microelectronics and Packaging — Pousada dos Pireneus Resort Pirenopolis, State Goias (Brazil)
    • Speech
    Modelling of the leakage drain current in accumulation-mode SOI pMOSFETs for high-temperature applications
    Bellodi, M. Iniguez, Benjamin[UCL] Flandre, Denis[UCL] Martino, J.A. (2001) Tenth International Symposium on Silicon-on-Insulator Technology and Devices — Washington, DC (USA)
    • Journal article
    Deep-submicrometer DC-to-RF SOI MOSFET macro-model
    Iniguez, Benjamin[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Demeus, Laurent[UCL] Neve, Amaury[UCL] Vanhoenacker-Janvier, Danielle[UCL] Simon, Pascal[UCL] Goffioul, M.[UCL] (2001) IEEE Transactions on Electron Devices — Vol. 48, no. 9, p. 1981-1988 (2001)
    • Journal article
    A review of leakage current in SOI CMOS ICs: impact on parametric testing techniques
    Iniguez, Benjamin Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Segura, Jaume (2003) Solid-State Electronics — Vol. 47, no. 11, p. 1959-1967 (2003)
    • Speech
    A physically-based continuous model for graded-channel SOI MOSFET
    Pavanello, Marcelo Antonio Iniguez, Benjamin Flandre, Denis[UCL] Martino, Joao Antonio (2002) XVII SBMicro Microelectronics Technology and Devices (ECS 2002) — Brazilia (Brazil)
    • Speech
    Potential of surface accumulation mode for deep-submicron fully-depleted SOI CMOS technologies
    Iniguez, Benjamin[UCL] Rauly, E.[UCL] Flandre, Denis[UCL] (2001) Tenth International Symposium on Silicon-on-Insulator Technology and Devices — Washington, DC (USA)
    • Speech
    Unified deep-submicron fully-depleted SOI MOSFET modeling for circuit simulation
    Iniguez, Benjamin Nève, Amaury[UCL] Flandre, Denis[UCL] Raynaud, C.[UCL] (1999) XIV Congreso de Diseño de Circuitos Integrados — Palma (Spain)
    • Speech
    C infinite - continuous AM SOI pMOSFET Model for High-Temperature Applications
    Houk, Youri Iniguez, Benjamin Flandre, Denis[UCL] Nazarov, Alexei (2005) First Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2005) — Granada (Spain)
    • Speech
    Study of the deep-submicron SOI MOSFET leakage current behavior at high temperatures
    Bellodi, Marcello Iniguez, Benjamin[UCL] Flandre, Denis[UCL] Raynaud, C.[UCL] Martino, Joao Antonio (2000) International Conference on Microelectronics and Packaging — Manaus (Brésil)
    • Speech
    A Fully Analytical Continuous Model for Graded-Channel SOI MOSFET for Analog Applications
    de Souza, Michelly Pavanello, M.A. Iniguez, Benjamin Flandre, Denis[UCL] (2004) 19th International Symposium on Microelectronics Technology and Devices (SBMICRO 2004) — Porto de Galinhas Beach (Brazil)
    • Speech
    A new fully-depleted SOI MOSFET macro-model valid from DC to RF
    Iniguez, Benjamin[UCL] Raskin, Jean-Pierre[UCL] Demeûs, Laurent[UCL] Nève de Mévergnies, Amaury[UCL] Goffioul, Michael[UCL] Simon, Pascal[UCL] Vanhoenacker-Janvier, Danielle[UCL] Flandre, Denis[UCL] (2001) Tenth International Symposium on Silicon-on-Insulator Technology and Devices — Washington, DC (USA)
    • Journal article
    SOI n-MOSFET low-frequency noise measurements and modeling from room temperature up to 250 degrees C
    Dessard, Vincent[UCL] Flandre, Denis[UCL] Iniguez, Benjamin Adriaensen, Stéphane[UCL] (2002) IEEE Transactions on Electron Devices — Vol. 49, no. 7, p. 1289-1295 (2002)
    • Journal article
    Review on double-gate MOSFETs and FinFETs modeling
    Cerdeira, Antonio Estrada, Magali Alvarado Pulido, José Joaquin Garduno, I. Contreras, E. Tinoco, J. Iniguez, Benjamin Kilchytska, Valeriya[UCL] Flandre, Denis[UCL] (2013) Facta Universitatis. Series Electronics and Energetics — Vol. 26, no. 3, p. 197-213 (December 2013)
    • Speech
    Testing SOI CMOS IC's with Parametric Testing Methods: a Fundamental Analysis
    Iniguez, Benjamin Raskin, Jean-Pierre[UCL] Simon, Pascal[UCL] Flandre, Denis[UCL] Segura, Jaume (2001) XVI Conference on Design of Circuits and Integrated Systems (DCIS 2001) — Porto (Portugal)
    • Speech
    CAD-compatible model for accumulation-mode (AM) SOI pMOSFETs
    Iniguez, Benjamin Gentinne, Bernard[UCL] Dessard, Vincent[UCL] Flandre, Denis[UCL] (1997) IEEE International SOI Conference 1997 — Tenya Lodge (USA)
    • Speech
    Direct MOSFET Parameters Extraction Using Fourier-Space Techniques
    Picos, R. Roca, M. Iniguez, Benjamin[UCL] Bellodi, M. Flandre, Denis[UCL] Garcia-Moreno, E. (2004) Fifth International Caracas Conference on Devices, Circuits and Systems — Dominican Republic

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