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All Publications

Displaying 15 results.
    • Journal article
    Low-frequency noise behaviour of graded-channel SOI nMOSFETs
    Simoen, E. Claeys, C. Chung, Tsung Ming[UCL] Flandre, Denis[UCL] Pavanello, M.A. Martino, J.A. Raskin, Jean-Pierre[UCL] (2006) Solid-State Electronics — Vol. 51, no. 2, p. 260-267 (2007)
    • Journal article
    On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs
    Simoen, Eddy Flandre, Denis[UCL] Claeys, C. Chung, T. M. Raskin, Jean-Pierre[UCL] (2007) IEEE Electron Device Letters — Vol. 28, no. 10, p. 919-921 (2007)
    • Journal article
    Low-frequency noise behavior of graded-channel SOI n-MOSFETs
    Simoen, E. Claeys, C. Chung, Tsung Ming[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] Pavanello, M.A. Martino, J.A. (2007) Solid-State Electronics, Special issue — Vol. 51, no. 2, p. 260-267 (2007)
    • Journal article
    The Length-Dependence of the 1/f Noise of Graded-Channel SOI nMOSFETs
    Simoen, E. Claeys, C. Chung, Tsung Ming[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2007) ECS Transactions — Vol. 9, no. 1, p. 373-381 (September)
    • Speech
    The low-frequency noise behaviour of graded-channel SOI nMOSFETs
    Simoen, E. Flandre, Denis[UCL] Claeys, C. Chung, T. M. Pavanello, M. A. Martino, J. A. Raskin, Jean-Pierre[UCL] (2007) 2nd Workshop of the Thematic-Network-on-Silicon-on-Insulator-Technology-Devices-and-Circuits (EUROSOI 06) — Grenoble (France)
    • Speech
    The Length-Dependence of the 1/f Noise of Graded-Channel SOI nMOSFETs
    Simoen, E. Claeys, C. Chung, Tsung Ming[UCL] Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2007) 22nd Symposium on Microelectronics Technology and Devices - SBMicro'2007 — Rio de Janeiro, Brazil
    • Speech
    Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
    Kilchytska, Valeriya[UCL] Alvarado Pulido, José Joaquin[UCL] Collaert, N. Rooyakers, R. Put, S. Claeys, C. Flandre, Denis[UCL] (2010) Sixth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2010) — Grenoble (France)
    • Speech
    High-energy neutrons effect on strained and non-strained SOI MuGFETs and planar MOSFETs
    Kilchytska, Valeriya[UCL] Alvarado Pulido, José Joaquin[UCL] Put, S. Collaert, N. Simoen, E. Claeys, C. Militaru, Otilia[UCL] Berger, Guy[UCL] Flandre, Denis[UCL] (2010) 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2010) — Gaeta (Italy)
    • Speech
    Low-frequency noise behavior of graded-channel SOI n-MOSFETs
    Simoen, E. Claeys, C. Chung, T. M. Flandre, Denis[UCL] Raskin, Jean-Pierre[UCL] (2006) Second Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits – EuroSOI’06 — Grenoble (France)