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Note: Fast and reliable fracture strain extraction technique applied to silicon at nanometer scale

Bibliographic reference Passi, Vikram ; Bhaskar, Umesh Kumar ; Pardoen, Thomas ; Sodervall, Ulf ; Nilsson, Bengt ; et. al. Note: Fast and reliable fracture strain extraction technique applied to silicon at nanometer scale. In: Review of Scientific Instruments, Vol. 82, p. 116106 (2011)
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