User menu

Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study

Bibliographic reference Idrissi, Hosni ; Tumer, Stuart ; Mitsuhara, Masatoshi ; Wang, Binjie ; Hata, Satoshi ; et. al. Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study. In: Microscopy and Microanalysis,
Permanent URL http://hdl.handle.net/2078.1/91713
  1. André N., Coulombier M., De Longueville V., Fabrègue D., Gets T., Gravier S., Pardoen T., Raskin J.-P., Microfabrication-based nanomechanical laboratory for testing the ductility of submicron aluminium films, 10.1016/j.mee.2007.05.039
  2. Barnard J. S., High-Resolution Three-Dimensional Imaging of Dislocations, 10.1126/science.1125783
  3. Batenburg K.J., Bals S., Sijbers J., Kübel C., Midgley P.A., Hernandez J.C., Kaiser U., Encina E.R., Coronado E.A., Van Tendeloo G., 3D imaging of nanomaterials by discrete tomography, 10.1016/j.ultramic.2009.01.009
  4. Biermans E., Molina L., Batenburg K. J., Bals S., Van Tendeloo G., Measuring Porosity at the Nanoscale by Quantitative Electron Tomography, 10.1021/nl103172r
  5. Chen J.H, Zandbergen H.W, Dyck D.Van, Atomic imaging in aberration-corrected high-resolution transmission electron microscopy, 10.1016/j.ultramic.2003.08.003
  6. Coulombier M., Boé A., Brugger C., Raskin J.P., Pardoen T., Imperfection-sensitive ductility of aluminium thin films, 10.1016/j.scriptamat.2010.01.048
  7. Diaz de la Rubia Tomas, Zbib Hussein M., Khraishi Tariq A., Wirth Brian D., Victoria Max, Caturla Maria Jose, 10.1038/35022544
  8. Dimiduk D.M., Uchic M.D., Parthasarathy T.A., Size-affected single-slip behavior of pure nickel microcrystals, 10.1016/j.actamat.2005.05.023
  9. Eyre, Vacancies '76 (1977)
  10. Fabregue, Micro Nanolett, 2, 13 (2007)
  11. Fish, Am Soc Test Mater, 611, 119 (1976)
  12. Ghoniem N.M., Singh B.N., Sun L.Z., Dı́az de la Rubia T., Interaction and accumulation of glissile defect clusters near dislocations, 10.1016/s0022-3115(99)00176-2
  13. Gravier S., Coulombier M., Safi A., Andre N., Boe A., Raskin J.-P., Pardoen T., New On-Chip Nanomechanical Testing Laboratory - Applications to Aluminum and Polysilicon Thin Films, 10.1109/jmems.2009.2020380
  14. Greer Julia R., Oliver Warren C., Nix William D., Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients, 10.1016/j.actamat.2004.12.031
  15. Haque M.A., Saif M.T.A., Microscale materials testing using MEMS actuators, 10.1109/84.911103
  16. Hemker K.J., Sharpe W.N., Microscale Characterization of Mechanical Properties, 10.1146/annurev.matsci.36.062705.134551
  17. Hosemann P., Swadener J.G., Kiener D., Was G.S., Maloy S.A., Li N., An exploratory study to determine applicability of nano-hardness and micro-compression measurements for yield stress estimation, 10.1016/j.jnucmat.2007.11.004
  18. Hutchinson C.R, Hackenberg R.E, Shiflet G.J, A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils, 10.1016/s0304-3991(02)00193-6
  19. Kacher J.P., Liu G.S., Robertson I.M., Visualization of grain boundary/dislocation interactions using tomographic reconstructions, 10.1016/j.scriptamat.2010.12.020
  20. Kadoyoshi Tomoko, Kaburaki Hideo, Shimizu Futoshi, Kimizuka Hajime, Jitsukawa Shiro, Li Ju, Molecular dynamics study on the formation of stacking fault tetrahedra and unfaulting of Frank loops in fcc metals, 10.1016/j.actamat.2007.01.010
  21. Kiener D., Motz C., Rester M., Jenko M., Dehm G., FIB damage of Cu and possible consequences for miniaturized mechanical tests, 10.1016/j.msea.2007.01.046
  22. Kiener D., Motz C., Schöberl T., Jenko M., Dehm G., Determination of Mechanical Properties of Copper at the Micron Scale, 10.1002/adem.200600129
  23. Kiritani M., Fukuta Y., Mima T., Iiyoshi E., Kizuka Y., Kojima S., Matsunami N., Formation of vacancy clustered defects from cascade collisions during heavy-ion irradiation and their annihilation by freely-migrating interstitial atoms, 10.1016/0022-3115(94)90054-x
  24. Kiritani M., Satoh Y., Kizuka Y., Arakawa K., Ogasawara Y., Arai S., Shimomura Y., Anomalous production of vacancy clusters and the possibility of plastic deformation of crystalline metals without dislocations, 10.1080/095008399176616
  25. Larson D.J, Foord D.T, Petford-Long A.K, Liew H, Blamire M.G, Cerezo A, Smith G.D.W, Field-ion specimen preparation using focused ion-beam milling, 10.1016/s0304-3991(99)00055-8
  26. Lowry M.B., Kiener D., LeBlanc M.M., Chisholm C., Florando J.N., Morris J.W., Minor A.M., Achieving the ideal strength in annealed molybdenum nanopillars, 10.1016/j.actamat.2010.05.052
  27. MARIEN, PLITZKO, SPOLENAK, KELLER, MAYER, Quantitative electron spectroscopic imaging studies of microelectronic metallization layers, 10.1046/j.1365-2818.1999.00476.x
  28. Midgley P.A., Weyland M., 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography, 10.1016/s0304-3991(03)00105-0
  29. Osetsky Yu.N., Serra A., Priego V., Interactions between mobile dislocation loops in Cu and α-Fe, 10.1016/s0022-3115(99)00179-8
  30. Raghavan R., Boopathy K., Ghisleni R., Pouchon M.A., Ramamurty U., Michler J., Ion irradiation enhances the mechanical performance of metallic glasses, 10.1016/j.scriptamat.2009.12.013
  31. Robach J. S., Robertson I. M., Wirth B. D., Arsenlis A., In-situ transmission electron microscopy observations and molecular dynamics simulations of dislocation-defect interactions in ion-irradiated copper, 10.1080/0141861031000065329
  32. Saka H., Noda K., Matsumoto K., Imura T., HVEM in-situ observations of dislocation behaviour in strongly electron-irradiated nickel, 10.1002/pssa.2210310115
  33. Shan Z. W., Mishra Raja K., Syed Asif S. A., Warren Oden L., Minor Andrew M., Mechanical annealing and source-limited deformation in submicrometre-diameter Ni crystals, 10.1038/nmat2085
  34. Shim S., Bei H., Miller M.K., Pharr G.M., George E.P., Effects of focused ion beam milling on the compressive behavior of directionally solidified micropillars and the nanoindentation response of an electropolished surface, 10.1016/j.actamat.2008.09.033
  35. Silcox J., Hirsch P. B., Direct observations of defects in quenched gold, 10.1080/14786435908238228
  36. Suzuki M., Fujimura A., Sato A., Nagakawa J., Yamamoto N., Shiraishi H., In situdeformation of proton-irradiated molybdenum in a high-voltage electron microscope, 10.1080/01418619108221194
  37. Tanaka Masaki, Higashida Kenji, Kaneko Kenji, Hata Satoshi, Mitsuhara Masatoshi, Crack tip dislocations revealed by electron tomography in silicon single crystal, 10.1016/j.scriptamat.2008.06.042
  38. Tsuchiya T., Hirata M., Chiba N., Udo R., Yoshitomi Y., Ando T., Sato K., Takashima K., Higo Y., Saotome Y., Ogawa H., Ozaki K., Cross comparison of thin-film tensile-testing methods examined using single-crystal silicon, polysilicon, nickel, and titanium films, 10.1109/jmems.2005.851820
  39. Uchic M. D., Sample Dimensions Influence Strength and Crystal Plasticity, 10.1126/science.1098993
  40. Victoria M, Baluc N, Bailat C, Dai Y, Luppo M.I, Scha̋ublin R, Singh B.N, The microstructure and associated tensile properties of irradiated fcc and bcc metals, 10.1016/s0022-3115(99)00203-2
  41. Zbib Hussein M., Dı́az de la Rubia Tomas, Rhee Moono, P. Hirth John, 3D dislocation dynamics: stress–strain behavior and hardening mechanisms in fcc and bcc metals, 10.1016/s0022-3115(99)00175-0